Walter Schmitt

Person

Traunreut, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for inductive signal transfer in sensing heads
- Patent number 5,109,223
- Issue date Apr 28, 1992
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Position measuring apparatus with multiple scanning locations
- Patent number 4,990,767
- Issue date Feb 5, 1991
- Dr. Johannes Heidenhain GmbH
- Alfons Ernst
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring device
- Patent number 4,982,508
- Issue date Jan 8, 1991
- Dr. Johannes Heidenhain GmbH
- Gunther Nelle
- G01 - MEASURING TESTING
Information Patent Grant
Process and arrangement for regulating the keying ratio of at least...
- Patent number 4,739,197
- Issue date Apr 19, 1988
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measuring scale coding system for length or angle measuring instrum...
- Patent number 4,701,615
- Issue date Oct 20, 1987
- Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Signal transmission system
- Patent number 4,688,019
- Issue date Aug 18, 1987
- Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device error monitoring system
- Patent number 4,678,948
- Issue date Jul 7, 1987
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Reference mark identification system for measuring instrument
- Patent number 4,654,527
- Issue date Mar 31, 1987
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Reference mark coding system
- Patent number 4,645,925
- Issue date Feb 24, 1987
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Scanning signal balancing circuit
- Patent number 4,628,201
- Issue date Dec 9, 1986
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Error correction system for digital length or angle measuring instr...
- Patent number 4,618,940
- Issue date Oct 21, 1986
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for digitally subdividing analog periodic signals
- Patent number 4,594,579
- Issue date Jun 10, 1986
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring circuit for positioning device
- Patent number 4,594,538
- Issue date Jun 10, 1986
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G05 - CONTROLLING REGULATING
Information Patent Grant
System for identifying reference marks in a path measuring device
- Patent number 4,519,140
- Issue date May 28, 1985
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 4,512,083
- Issue date Apr 23, 1985
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Electrical circuit for absolute position measuring device
- Patent number 4,469,958
- Issue date Sep 4, 1984
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Switching apparatus for absolute position measuring device
- Patent number 4,469,940
- Issue date Sep 4, 1984
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for digital photoelectric length or angle measuring...
- Patent number 4,423,958
- Issue date Jan 3, 1984
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Frequency to voltage converter for a digital tachometer
- Patent number 4,420,699
- Issue date Dec 13, 1983
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric digital position measuring system
- Patent number 4,385,836
- Issue date May 31, 1983
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric digital measuring instrument balancing circuit
- Patent number 4,369,366
- Issue date Jan 18, 1983
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Incremental measuring system with selectively designated reference...
- Patent number 4,363,964
- Issue date Dec 14, 1982
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Variably biased photoelectric circuit
- Patent number 4,302,668
- Issue date Nov 24, 1981
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring projectile velocity
- Patent number 4,253,020
- Issue date Feb 24, 1981
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING

Walter Schmitt

Person

Patents Grantslast 30 patents

Apparatus for inductive signal transfer in sensing heads

Position measuring apparatus with multiple scanning locations

Position measuring device

Process and arrangement for regulating the keying ratio of at least...

Measuring scale coding system for length or angle measuring instrum...

Signal transmission system

Measuring device error monitoring system

Reference mark identification system for measuring instrument

Reference mark coding system

Scanning signal balancing circuit

Error correction system for digital length or angle measuring instr...

Apparatus for digitally subdividing analog periodic signals

Monitoring circuit for positioning device

System for identifying reference marks in a path measuring device

Measuring apparatus

Electrical circuit for absolute position measuring device

Switching apparatus for absolute position measuring device

Test apparatus for digital photoelectric length or angle measuring...

Frequency to voltage converter for a digital tachometer

Photoelectric digital position measuring system

Photoelectric digital measuring instrument balancing circuit

Incremental measuring system with selectively designated reference...

Variably biased photoelectric circuit

Apparatus for measuring projectile velocity