Walter Skoczylas

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Aloha, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for attachment of an electrode into an inductively-coupled p...
- Patent number 9,530,625
- Issue date Dec 27, 2016
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma source for charged particle beam system
- Patent number 9,196,451
- Issue date Nov 24, 2015
- FEI Company
- Shouyin Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for attachment of an electrode into a plasma source
- Patent number 9,053,895
- Issue date Jun 9, 2015
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for attachment of an electrode into an inductively coupled p...
- Patent number 8,928,210
- Issue date Jan 6, 2015
- FEI Comapny
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam system using multiple electron beams
- Patent number 6,797,953
- Issue date Sep 28, 2004
- FEI Company
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam system
- Patent number 6,710,338
- Issue date Mar 23, 2004
- FEI Company
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ATTACHMENT OF AN ELECTRODE INTO AN INDUCTIVELY-COUPLED P...
- Publication number 20150357166
- Publication date Dec 10, 2015
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for Attachment of an Electrode into an Inductively Coupled P...
- Publication number 20130134855
- Publication date May 30, 2013
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Plasma Source for Charged Particle Beam System
- Publication number 20120280136
- Publication date Nov 8, 2012
- FEI Company
- Shouyin Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam system using multiple electron beams
- Publication number 20020117967
- Publication date Aug 29, 2002
- Robert L. Gerlach
- B82 - NANO-TECHNOLOGY
Information Patent Application
Focused ion beam system
- Publication number 20020084426
- Publication date Jul 4, 2002
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS