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Walter van den Hoogenhof
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Almelo, NL
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last 30 patents
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Patent Grant
X-ray diffraction and fluorescence
Patent number
7,978,820
Issue date
Jul 12, 2011
PANalytical B.V.
Alexander Kharchenko
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
X-RAY DIFFRACTION AND FLUORESCENCE
Publication number
20110096898
Publication date
Apr 28, 2011
Alexander Kharchenko
G01 - MEASURING TESTING