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Walterus A. L. A. Van Egeraat
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Almelo, NL
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last 30 patents
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Patent Grant
Apparatus for X-ray analysis with a simplified detector motion
Patent number
6,487,270
Issue date
Nov 26, 2002
Koninklijke Philips Electronics N.V.
Walterus A. L. A. Van Egeraat
G01 - MEASURING TESTING
Information
Patent Grant
X-ray spectrometer with an analyzer crystal having a partly variabl...
Patent number
5,914,997
Issue date
Jun 22, 1999
U.S. Philips Corporation
Walterus A. L. A. Van Egeraat
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analysis apparatus and scanning unit suitable for use in such...
Patent number
5,438,613
Issue date
Aug 1, 1995
U.S. Philips Corporation
Wilhelmus A. H. Gijzen
G01 - MEASURING TESTING
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Patent Grant
X-ray analysis apparatus comprising a saggitally curved analysis cr...
Patent number
5,008,910
Issue date
Apr 16, 1991
U.S. Philips Corporation
Walterus A. L. A. Van Egeraat
G01 - MEASURING TESTING