Wan-Chiu LI

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods of multi-scale meshing for geologic time modeling
- Patent number 10,795,053
- Issue date Oct 6, 2020
- EMERSON PARADIGM HOLDING LLC
- Jean-Claude Dulac
- G01 - MEASURING TESTING
Information Patent Grant
System and method for editing geological models by switching betwee...
- Patent number 10,466,388
- Issue date Nov 5, 2019
- EMERSON PARADIGM HOLDING LLC
- Wan-Chiu Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for generating a geological model honoring hori...
- Patent number 10,114,134
- Issue date Oct 30, 2018
- EMERSON PARADIGM HOLDING LLC
- Wan-Chiu Li
- G01 - MEASURING TESTING
Information Patent Grant
Method and appartus for transforming a stratigraphic grid
- Patent number 8,635,052
- Issue date Jan 21, 2014
- Paradigm Ltd.
- Jean-Laurent Mallet
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR GENERATING A HEXAHEDRAL MESH
- Publication number 20240185522
- Publication date Jun 6, 2024
- TESSAEL
- Wan-Chiu LI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR EDITING GEOLOGICAL MODELS BY SWITCHING BETWEE...
- Publication number 20180067229
- Publication date Mar 8, 2018
- PARADIGM SCIENCES LTD.
- Wan-Chiu Li
- G01 - MEASURING TESTING
Information Patent Application
Device, system and method for a structure and stratigraphy preservi...
- Publication number 20170184760
- Publication date Jun 29, 2017
- PARADIGM SCIENCES LTD.
- Wan-Chiu Li
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS OF MULTI-SCALE MESHING FOR GEOLOGIC TIME MODELING
- Publication number 20150120262
- Publication date Apr 30, 2015
- PARADIGM GEOPHYSICAL CORP.
- Jean-Claude DULAC
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR GENERATING A GEOLOGICAL MODEL HONORING HORI...
- Publication number 20130231903
- Publication date Sep 5, 2013
- Wan-Chiu LI
- G01 - MEASURING TESTING