Wan Sang Wong

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Lubbock, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for classifying an anomaly
- Patent number 6,483,938
- Issue date Nov 19, 2002
- Texas Instruments Incorporated
- A. Kathleen Hennessey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for identifying defects in a semiconductor
- Patent number 6,292,582
- Issue date Sep 18, 2001
- YouLing Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for knowledgebase generation and management
- Patent number 6,246,787
- Issue date Jun 12, 2001
- Texas Instruments Incorporated
- A. Kathleen Hennessey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for aligning and measuring misregistration
- Patent number 5,696,835
- Issue date Dec 9, 1997
- Texas Instruments Incorporated
- A. Kathleen Hennessey
- G06 - COMPUTING CALCULATING COUNTING