Wang Jo Fei

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Hsinchu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Advanced process control with novel sampling policy
- Patent number 8,392,009
- Issue date Mar 5, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wang Jo Fei
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for tuning advanced process control parameters
- Patent number 8,229,588
- Issue date Jul 24, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for implementing wafer acceptance test (“WAT”) ad...
- Patent number 8,219,341
- Issue date Jul 10, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ADVANCED PROCESS CONTROL WITH NOVEL SAMPLING POLICY
- Publication number 20100249974
- Publication date Sep 30, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wang Jo Fei
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEM AND METHOD FOR IMPLEMENTING WAFER ACCEPTANCE TEST ("WAT") AD...
- Publication number 20100250172
- Publication date Sep 30, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR TUNING ADVANCED PROCESS CONTROL PARAMETERS
- Publication number 20100228370
- Publication date Sep 9, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING