Wanggen Zhang

Person

Suzhou, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit with low power scan system
- Patent number 10,338,136
- Issue date Jul 2, 2019
- NXP USA, INC.
- Ling Wang
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with low power scan system
- Patent number 9,964,596
- Issue date May 8, 2018
- NXP USA, INC.
- Ling Wang
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with secure scan enable
- Patent number 9,927,490
- Issue date Mar 27, 2018
- NXP USA, INC.
- Pingli Hao
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing integrated circuit
- Patent number 9,805,826
- Issue date Oct 31, 2017
- NXP USA,INC.
- Weiwei Sang
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in-self-test circuit for sigma-delta modulator
- Patent number 9,748,970
- Issue date Aug 29, 2017
- NXP USA, INC.
- Zhou Fang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On-chip current test circuit
- Patent number 9,726,724
- Issue date Aug 8, 2017
- NXP USA, INC.
- Xiuqiang Xu
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit for very low voltage and bias scan testing of integrat...
- Patent number 9,551,749
- Issue date Jan 24, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Wanggen Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Reconfigurable circuit and decoder therefor
- Patent number 9,110,133
- Issue date Aug 18, 2015
- FREESCALE SEMICONDUCOTR, INC.
- Ling Wang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for performing scan test
- Patent number 8,935,584
- Issue date Jan 13, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Guoping Wan
- G11 - INFORMATION STORAGE
Information Patent Grant
Low power scan flip-flop cell
- Patent number 8,880,965
- Issue date Nov 4, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Wanggen Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Reconfigurable integrated circuit
- Patent number 8,736,302
- Issue date May 27, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Xu Zhang
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT WITH LOW POWER SCAN SYSTEM
- Publication number 20180059178
- Publication date Mar 1, 2018
- NXP USA, Inc.
- Ling Wang
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH LOW POWER SCAN SYSTEM
- Publication number 20170146599
- Publication date May 25, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Ling Wang
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH SECURE SCAN ENABLE
- Publication number 20170089978
- Publication date Mar 30, 2017
- FREESCALE SEMICONDUCTOR, INC.
- PINGLI HAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING INTEGRATED CIRCUIT
- Publication number 20160365157
- Publication date Dec 15, 2016
- FREESCALE SEMICONDUCTOR, INC.
- WEIWEI SANG
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT FOR VERY LOW VOLTAGE AND BIAS SCAN TESTING OF INTEGRAT...
- Publication number 20160178695
- Publication date Jun 23, 2016
- FREESCALE SEMICONDUCTOR, INC.
- WANGGEN ZHANG
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP CURRENT TEST CIRCUIT
- Publication number 20150323590
- Publication date Nov 12, 2015
- Xiuqiang Xu
- G01 - MEASURING TESTING
Information Patent Application
RECONFIGURABLE CIRCUIT AND DECODER THEREFOR
- Publication number 20150048863
- Publication date Feb 19, 2015
- Ling Wang
- G01 - MEASURING TESTING
Information Patent Application
LOW POWER SCAN FLIP-FLOP CELL
- Publication number 20140040688
- Publication date Feb 6, 2014
- Wanggen Zhang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PERFORMING SCAN TEST
- Publication number 20140032986
- Publication date Jan 30, 2014
- Guoping WAN
- G01 - MEASURING TESTING
Information Patent Application
RECONFIGURABLE INTEGRATED CIRCUIT
- Publication number 20130300497
- Publication date Nov 14, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Xu Zhang
- H01 - BASIC ELECTRIC ELEMENTS

Wanggen Zhang

Person

Patents Grantslast 30 patents

Integrated circuit with low power scan system

Integrated circuit with low power scan system

Integrated circuit with secure scan enable

Method and apparatus for testing integrated circuit

Built-in-self-test circuit for sigma-delta modulator

On-chip current test circuit

Test circuit for very low voltage and bias scan testing of integrat...

Reconfigurable circuit and decoder therefor

System and method for performing scan test

Low power scan flip-flop cell

Reconfigurable integrated circuit

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT WITH LOW POWER SCAN SYSTEM

INTEGRATED CIRCUIT WITH LOW POWER SCAN SYSTEM

INTEGRATED CIRCUIT WITH SECURE SCAN ENABLE

METHOD AND APPARATUS FOR TESTING INTEGRATED CIRCUIT

TEST CIRCUIT FOR VERY LOW VOLTAGE AND BIAS SCAN TESTING OF INTEGRAT...

ON-CHIP CURRENT TEST CIRCUIT

RECONFIGURABLE CIRCUIT AND DECODER THEREFOR

LOW POWER SCAN FLIP-FLOP CELL

SYSTEM AND METHOD FOR PERFORMING SCAN TEST

RECONFIGURABLE INTEGRATED CIRCUIT