Warren S. Crippen

Person

Aloha, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Increasing current carrying capability through direct liquid coolin...
- Patent number 9,360,502
- Issue date Jun 7, 2016
- Intel Corporation
- Warren S. Crippen
- G01 - MEASURING TESTING
Information Patent Grant
Test probe structures and methods including positioning test probe...
- Patent number 9,279,830
- Issue date Mar 8, 2016
- Intel Corporation
- Roy E. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Thin film probe card contact drive system
- Patent number 7,436,193
- Issue date Oct 14, 2008
- Intel Corporation
- Warren Stuart Crippen
- G01 - MEASURING TESTING
Information Patent Grant
Thin film probe card contact drive system
- Patent number 7,230,438
- Issue date Jun 12, 2007
- Intel Corporation
- Warren Stuart Crippen
- G01 - MEASURING TESTING
Information Patent Grant
Thin film probe card contact drive system
- Patent number 6,759,861
- Issue date Jul 6, 2004
- Intel Corporation
- Warren Stuart Crippen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST PROBES
- Publication number 20140239995
- Publication date Aug 28, 2014
- Roy E. Swart
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY AND METHODS FOR DETECTION OF LIQUID
- Publication number 20140224990
- Publication date Aug 14, 2014
- Kip P. Stevenson
- G01 - MEASURING TESTING
Information Patent Application
INCREASING CURRENT CARRYING CAPABILITY THROUGH DIRECT LIQUID COOLIN...
- Publication number 20140210499
- Publication date Jul 31, 2014
- Warren S. Crippen
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM PROBE CARD CONTACT DRIVE SYSTEM
- Publication number 20070212900
- Publication date Sep 13, 2007
- Intel Corporation
- Warren Stuart Crippen
- G01 - MEASURING TESTING
Information Patent Application
Microelectronic die including thermally conductive structure in a s...
- Publication number 20060246621
- Publication date Nov 2, 2006
- Intel Corporation
- Warren Stuart Crippen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test card assembly
- Publication number 20060162955
- Publication date Jul 27, 2006
- Warren Stuart Crippen
- G01 - MEASURING TESTING
Information Patent Application
Thin film probe card contact drive system
- Publication number 20040232931
- Publication date Nov 25, 2004
- Intel Corporation
- Warren Stuart Crippen
- G01 - MEASURING TESTING
Information Patent Application
Thin film probe card contact drive system
- Publication number 20040021474
- Publication date Feb 5, 2004
- Intel Corporation
- Warren Stuart Crippen
- G01 - MEASURING TESTING
Information Patent Application
Silicon space transformer and method of manufacturing same
- Publication number 20030150640
- Publication date Aug 14, 2003
- Warren Stuart Crippen
- G01 - MEASURING TESTING
Information Patent Application
Microelectronic die providing improved heat dissipation, and method...
- Publication number 20030151132
- Publication date Aug 14, 2003
- Warren Stuart Crippen
- H01 - BASIC ELECTRIC ELEMENTS

Warren S. Crippen

Person

Patents Grantslast 30 patents

Increasing current carrying capability through direct liquid coolin...

Test probe structures and methods including positioning test probe...

Thin film probe card contact drive system

Thin film probe card contact drive system

Thin film probe card contact drive system

Patents Applicationslast 30 patents

TEST PROBES

METROLOGY AND METHODS FOR DETECTION OF LIQUID

INCREASING CURRENT CARRYING CAPABILITY THROUGH DIRECT LIQUID COOLIN...

THIN FILM PROBE CARD CONTACT DRIVE SYSTEM

Microelectronic die including thermally conductive structure in a s...

Test card assembly

Thin film probe card contact drive system

Thin film probe card contact drive system

Silicon space transformer and method of manufacturing same

Microelectronic die providing improved heat dissipation, and method...