Warren W. Lin

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Center mount two piece brake rotor
- Patent number 7,568,560
- Issue date Aug 4, 2009
- Warren Lin
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Reinforced brake rotor
- Patent number 7,219,777
- Issue date May 22, 2007
- Warren Lin
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 7,199,882
- Issue date Apr 3, 2007
- GSI Group Corporation
- Donald J. Svetkoff
- G01 - MEASURING TESTING
Information Patent Grant
Vented slot brake rotor
- Patent number 7,097,007
- Issue date Aug 29, 2006
- Warren Lin
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Method and system for 3D imaging of target regions
- Patent number 6,750,974
- Issue date Jun 15, 2004
- GSI Lumonics Corporation
- Donald J. Svetkoff
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 6,366,357
- Issue date Apr 2, 2002
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 6,249,347
- Issue date Jun 19, 2001
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 6,181,425
- Issue date Jan 30, 2001
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 6,177,998
- Issue date Jan 23, 2001
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Methods for the in-process detection of workpieces in a CMP environ...
- Patent number 5,993,289
- Issue date Nov 30, 1999
- SpeedFam-IPEC Corporation
- Robert F. Allen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods for the in-process detection of workpieces with a monochrom...
- Patent number 5,961,369
- Issue date Oct 5, 1999
- SpeedFam-IPEC Corp.
- Anthony L. Bartels
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and apparatus for detecting removal of thin film layers dur...
- Patent number 5,872,633
- Issue date Feb 16, 1999
- Speedfam Corporation
- Paul Holzapfel
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus for the in-process detection of workpieces with a monochr...
- Patent number 5,823,853
- Issue date Oct 20, 1998
- Speedfam Corporation
- Anthony L. Bartels
- G05 - CONTROLLING REGULATING
Information Patent Grant
Apparatus for the in-process detection of workpieces in a CMP envir...
- Patent number 5,733,171
- Issue date Mar 31, 1998
- Speedfam Corporation
- Robert F. Allen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Wide band non-coated beam splitter
- Patent number 5,164,857
- Issue date Nov 17, 1992
- Nanometrics, Incorporated
- Warren W. Lin
- G02 - OPTICS
Information Patent Grant
Thin dielectric film measuring system
- Patent number 4,826,321
- Issue date May 2, 1989
- Nanometrics, Incorporated
- Vincent J. Coates
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Brake rotor
- Publication number 20050269174
- Publication date Dec 8, 2005
- Warren Lin
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Method and system for high speed measuring of microscopic targets
- Publication number 20050174580
- Publication date Aug 11, 2005
- GSI Lumonics Corporation
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Application
Reinforced brake rotor
- Publication number 20040200675
- Publication date Oct 14, 2004
- Warren Lin
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Vented slot brake rotor
- Publication number 20040200678
- Publication date Oct 14, 2004
- Warren Lin
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Method and system for high speed measuring of microscopic targets
- Publication number 20040179207
- Publication date Sep 16, 2004
- GSI Lumonics Corporation
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Application
Method and system for high speed measuring of microscopic targets
- Publication number 20030184764
- Publication date Oct 2, 2003
- General Scanning, Inc.
- Donald J. Svetkoff
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR THE IN-PROCESS MEASUREMENT OF THIN FILM L...
- Publication number 20010012108
- Publication date Aug 9, 2001
- PAUL HOLZAPFEL
- G01 - MEASURING TESTING

Warren W. Lin

Person

Patents Grantslast 30 patents

Center mount two piece brake rotor

Reinforced brake rotor

Method and system for high speed measuring of microscopic targets

Vented slot brake rotor

Method and system for 3D imaging of target regions

Method and system for high speed measuring of microscopic targets

Method and system for high speed measuring of microscopic targets

Method and system for high speed measuring of microscopic targets

Method and system for high speed measuring of microscopic targets

Methods for the in-process detection of workpieces in a CMP environ...

Methods for the in-process detection of workpieces with a monochrom...

Methods and apparatus for detecting removal of thin film layers dur...

Apparatus for the in-process detection of workpieces with a monochr...

Apparatus for the in-process detection of workpieces in a CMP envir...

Wide band non-coated beam splitter

Thin dielectric film measuring system

Patents Applicationslast 30 patents

Brake rotor

Method and system for high speed measuring of microscopic targets

Reinforced brake rotor

Vented slot brake rotor

Method and system for high speed measuring of microscopic targets

Method and system for high speed measuring of microscopic targets

METHODS AND APPARATUS FOR THE IN-PROCESS MEASUREMENT OF THIN FILM L...