TREA

Wataru Doi

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Frequency characteristics measuring device
    • Patent number 8,368,382
    • Issue date Feb 5, 2013
    • Advantest Corporation
    • Satoru Aoyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Frequency characteristic measuring apparatus
    • Patent number 7,952,344
    • Issue date May 31, 2011
    • Advantest Corporation
    • Wataru Doi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectrum analyzer
    • Patent number 6,140,809
    • Issue date Oct 31, 2000
    • Advantest Corporation
    • Wataru Doi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectrum analyzer
    • Patent number 6,060,878
    • Issue date May 9, 2000
    • Advantest Corp.
    • Wataru Doi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents