Wataru Itoh

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Assembly for LSI test and method for the test
- Patent number 7,251,761
- Issue date Jul 31, 2007
- Matsushita Electric Industrial Co., Ltd.
- Wataru Itoh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Assembly for LSI test and method for the test
- Publication number 20040160237
- Publication date Aug 19, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Wataru Itoh
- G01 - MEASURING TESTING