Wataru KAWASAKI

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Wafer test system, probe card replacing method, and prober
- Patent number 12,282,061
- Issue date Apr 22, 2025
- Tokyo Seimitsu Co., Ltd.
- Akira Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Playback management device and program used therefor
- Patent number 9,720,641
- Issue date Aug 1, 2017
- Takayasu Satake
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
WAFER TEST SYSTEM, PROBE CARD REPLACING METHOD, AND PROBER
- Publication number 20240369623
- Publication date Nov 7, 2024
- TOKYO SEIMITSU CO., LTD.
- Akira YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
REPLAY MANAGEMENT DEVICE AND PROGRAM USED IN SAME
- Publication number 20150363158
- Publication date Dec 17, 2015
- DeNA Co., Ltd.
- Takayasu SATAKE
- G06 - COMPUTING CALCULATING COUNTING