Wataru Kotake

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device
- Patent number 9,287,083
- Issue date Mar 15, 2016
- Hitachi High-Technologies Corporation
- Shinichi Tomita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and inclined observation image display...
- Patent number 9,012,842
- Issue date Apr 21, 2015
- Hitachi High-Technologies Corporation
- Wataru Kotake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,097,848
- Issue date Jan 17, 2012
- Hitachi High-Technologies Corporation
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM ADJUSTMENT ASSISTANCE DEVICE AND METHOD
- Publication number 20150124077
- Publication date May 7, 2015
- Hitachi High-Technologies Corporation
- Naohiko Fukaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND INCLINED OBSERVATION IMAGE DISPLAY...
- Publication number 20150001393
- Publication date Jan 1, 2015
- Wataru Kotake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20130299715
- Publication date Nov 14, 2013
- Hitachi High-Technologies Corporation
- Shinichi Tomita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20090230304
- Publication date Sep 17, 2009
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS