Wataru Narazaki

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of connecting probe pin to circuit board and method of manuf...
- Patent number 7,325,304
- Issue date Feb 5, 2008
- Advantest Corporation
- Wataru Narazaki
- G01 - MEASURING TESTING
Information Patent Grant
Sampler module, sampling waveform measurement device using the samp...
- Patent number 5,801,375
- Issue date Sep 1, 1998
- Advantest Corporation
- Kouji Sasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe card, production method thereof and repairing method of probe...
- Publication number 20090039904
- Publication date Feb 12, 2009
- Advantest Corporation
- Hidenori Kitazume
- G01 - MEASURING TESTING
Information Patent Application
Method of connecting probe pin to circuit board and method of manuf...
- Publication number 20050258847
- Publication date Nov 24, 2005
- Advantest Corporation
- Wataru Narazaki
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing a probe pin and a probe card
- Publication number 20040154165
- Publication date Aug 12, 2004
- Takehisa Takoshima
- G01 - MEASURING TESTING
Information Patent Application
Probe card, probe card manufacturing method, and contact
- Publication number 20030224627
- Publication date Dec 4, 2003
- Hidenori Kitazume
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR