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Wataru Sakurai
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Hirakata, JP
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last 30 patents
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Patent Grant
Semiconductor unit package, semiconductor unit packaging method, an...
Patent number
5,641,996
Issue date
Jun 24, 1997
Matsushita Electric Industrial Co., Ltd.
Kazunori Omoya
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Testing apparatus for dielectric breakdown caused by tracking pheno...
Patent number
4,339,708
Issue date
Jul 13, 1982
Matsushita Electric Industrial Co., Ltd.
Mitsuru Saito
G01 - MEASURING TESTING
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Patent Grant
Process for analyzing charged particles
Patent number
4,189,639
Issue date
Feb 19, 1980
Matsushita Electric Industrial Co., Ltd.
Yoshiaki Kai
G01 - MEASURING TESTING