Wayne A Weimer

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for controlling deposition parameters in producin...
- Patent number 6,838,121
- Issue date Jan 4, 2005
- Zyvex Corporation
- Wayne A. Weimer
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for generating a visible image with an infrare...
- Patent number 6,833,822
- Issue date Dec 21, 2004
- Raytheon Company
- Paul Klocek
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHOD FOR FABRICATING SUBSTRATE SURFACES FOR SERS AND...
- Publication number 20100040979
- Publication date Feb 18, 2010
- Wayne A. Weimer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Systems and method for fabricating substrate surfaces for SERS and...
- Publication number 20060275541
- Publication date Dec 7, 2006
- Wayne A. Weimer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Systems and methods for detection of low concentration of molecules...
- Publication number 20040096981
- Publication date May 20, 2004
- Zyvex Corporation
- Wayne A Weimer
- G01 - MEASURING TESTING
Information Patent Application
System and method for controlling deposition parameters in producin...
- Publication number 20030026900
- Publication date Feb 6, 2003
- Zyvex Corporation
- Wayne A Weimer
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for generating a visible image with an infrare...
- Publication number 20020135571
- Publication date Sep 26, 2002
- Paul Klocek
- G02 - OPTICS