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Wayne E. Wentworth
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Houston, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Chlorine specific gas chromatographic detector
Patent number
6,133,740
Issue date
Oct 17, 2000
Valco Instrument Co., Inc
Wayne E. Wentworth
G01 - MEASURING TESTING
Information
Patent Grant
System for detecting compounds in a gaseous sample using photoioniz...
Patent number
5,767,683
Issue date
Jun 16, 1998
Stanley D. Stearns
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for identifying and quantifying compounds usi...
Patent number
5,594,346
Issue date
Jan 14, 1997
Valco Instruments Co., Inc.
Stanley D. Stearns
G01 - MEASURING TESTING
Information
Patent Grant
Photoionization detector incorporating a dopant and carrier gas flow
Patent number
5,541,519
Issue date
Jul 30, 1996
Stanley D. Stearns
G01 - MEASURING TESTING
Information
Patent Grant
High voltage spark excitation and ionization system including disc...
Patent number
5,532,599
Issue date
Jul 2, 1996
Stanley D. Stearns
G01 - MEASURING TESTING
Information
Patent Grant
Gas sampling apparatus including a sealed chamber cooperative with...
Patent number
5,528,150
Issue date
Jun 18, 1996
Stanley D. Stearns
G01 - MEASURING TESTING
Information
Patent Grant
System for identifying and quantifying selected constituents of gas...
Patent number
5,394,092
Issue date
Feb 28, 1995
Valco Instruments Co., Inc.
Wayne E. Wentworth
G01 - MEASURING TESTING
Information
Patent Grant
Improved system for detecting compounds in a gaseous sample using i...
Patent number
5,394,090
Issue date
Feb 28, 1995
Wayne E. Wentworth
G01 - MEASURING TESTING
Information
Patent Grant
System for detecting compounds in a gaseous sample by measuring pho...
Patent number
5,394,091
Issue date
Feb 28, 1995
Wayne E. Wentworth
G01 - MEASURING TESTING
Information
Patent Grant
High voltage spark excitation and ionization detector system with a...
Patent number
5,317,271
Issue date
May 31, 1994
Valco Instruments, Co.
Wayne E. Wentworth
G01 - MEASURING TESTING
Information
Patent Grant
High voltage spark excitation and ionization detector system
Patent number
5,153,519
Issue date
Oct 6, 1992
Wayne E. Wentworth
G01 - MEASURING TESTING