Wayne G. Fisher

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Allen, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wafer temperature measurement system and method
- Patent number 5,102,231
- Issue date Apr 7, 1992
- Texas Instruments Incorporated
- Lee M. Loewenstein
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit planarization by mechanical polishing
- Patent number 4,879,258
- Issue date Nov 7, 1989
- Texas Instruments Incorporated
- Wayne G. Fisher
- B24 - GRINDING POLISHING
Information Patent Grant
Processing apparatus for wafers
- Patent number 4,857,132
- Issue date Aug 15, 1989
- Texas Instruments Incorporated
- Wayne G. Fisher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processing apparatus
- Patent number 4,832,779
- Issue date May 23, 1989
- Texas Instruments Incorporated
- Wayne G. Fisher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processing apparatus and method
- Patent number 4,830,700
- Issue date May 16, 1989
- Texas Instruments Incorporated
- Cecil J. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for easing surface particle removal by size in...
- Patent number 4,777,804
- Issue date Oct 18, 1988
- Texas Instruments Incorporated
- Robert A. Bowling
- B08 - CLEANING