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Wayne K. Borglum
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Santa Clara County, CA, US
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last 30 patents
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Patent Grant
Semiconductor surface resistivity probe with semiconductor temperat...
Patent number
5,260,668
Issue date
Nov 9, 1993
Prometrix Corporation
Chester L. Mallory
G01 - MEASURING TESTING
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Patent Grant
Apparatus for handling semiconductor wafers
Patent number
4,907,931
Issue date
Mar 13, 1990
Prometrix Corporation
Chester L. Mallory
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
High accuracy film thickness measurement system
Patent number
4,776,695
Issue date
Oct 11, 1988
Prometrix Corporation
Hung van Pham
G01 - MEASURING TESTING