Wayne Kevin Beebe

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Essex Junction, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Testable programmable gate array and associated LSSD/deterministic...
- Patent number 6,021,513
- Issue date Feb 1, 2000
- International Business Machines Corporation
- Wayne Kevin Beebe
- G01 - MEASURING TESTING
Information Patent Grant
Testable programmable gate array and associated LSSD/deterministic...
- Patent number 5,867,507
- Issue date Feb 2, 1999
- International Business Machines Corporation
- Wayne Kevin Beebe
- G01 - MEASURING TESTING