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Wayne Petitto
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Leominster, MA, US
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last 30 patents
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Patent Grant
Semiconductor test system with easily changed interface unit
Patent number
6,756,800
Issue date
Jun 29, 2004
Teradyne, Inc.
Michael A. Chiu
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Semiconductor test system with easily changed interface unit
Publication number
20030194821
Publication date
Oct 16, 2003
Michael A. Chiu
G01 - MEASURING TESTING