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Wayne R. Dannels
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Mentor, OH, US
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for robust shimming for magnetic resonance imaging
Patent number
11,774,530
Issue date
Oct 3, 2023
Canon Medical Systems Corporation
Wayne Richard Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Parallel MRI with spatially misregistered signal
Patent number
10,534,060
Issue date
Jan 14, 2020
Toshiba Medical Systems Corporation
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging apparatus
Patent number
10,365,344
Issue date
Jul 30, 2019
Toshiba Medical Systems Corporation
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for reducing artifacts in MRI images
Patent number
10,089,722
Issue date
Oct 2, 2018
Toshiba Medical Systems Corporation
Wayne R. Dannels
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Accelerated MRI using radial strips and undersampling of k-space
Patent number
9,983,283
Issue date
May 29, 2018
Toshiba Medical Systems Corporation
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging method and magnetic resonance imaging ap...
Patent number
9,841,483
Issue date
Dec 12, 2017
Toshiba Medical Systems Corporation
Andrew J. Wheaton
G01 - MEASURING TESTING
Information
Patent Grant
Mapping eddy current fields in MRI system
Patent number
9,709,653
Issue date
Jul 18, 2017
Toshiba Medical Systems Corporation
Andrew J. Wheaton
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging apparatus and magnetic resonance imaging...
Patent number
9,606,210
Issue date
Mar 28, 2017
Toshiba Medical Systems Corporation
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging with consistent geometries
Patent number
9,581,671
Issue date
Feb 28, 2017
Toshiba Medical Systems Corporation
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
MRI ghosting correction using unequal magnitudes ratio
Patent number
9,476,959
Issue date
Oct 25, 2016
Toshiba Medical Systems Corporation
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Spatially shaped pre-saturation profile for enhanced non-contrast MRA
Patent number
8,854,041
Issue date
Oct 7, 2014
Kabushiki Kaisha Toshiba
Andrew J. Wheaton
G01 - MEASURING TESTING
Information
Patent Grant
Spatial intensity correction for RF shading non-uniformities in MRI
Patent number
8,810,242
Issue date
Aug 19, 2014
Kabushiki Kaisha Toshiba
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Pulsed ASL using tagging pulse pattern encoding/decoding of flowing...
Patent number
8,610,433
Issue date
Dec 17, 2013
Kabushiki Kaisha Toshiba
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
B1 and/or B0 mapping in MRI system using k-space spatial frequency...
Patent number
8,502,538
Issue date
Aug 6, 2013
Kabushiki Kaisha Toshiba
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Spatial intensity correction for RF shading non-uniformities in MRI
Patent number
8,217,652
Issue date
Jul 10, 2012
Kabushiki Kaisha Toshiba
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for designing and/or implementing variable fli...
Patent number
8,212,562
Issue date
Jul 3, 2012
Kabushiki Kaisha Toshiba
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Method of motion correction for dynamic volume alignment without ti...
Patent number
8,126,230
Issue date
Feb 28, 2012
Koninklijke Philips Electronics N.V.
Andrew J. Wheaton
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
B1 mapping in MRI system using k-space spatial frequency domain fil...
Patent number
8,077,955
Issue date
Dec 13, 2011
Kabushiki Kaisha Toshiba
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Integrated system of MRI RF loop coils plus spacing fixtures with b...
Patent number
7,646,199
Issue date
Jan 12, 2010
Koninklijke Philips Electronics N.V.
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging with short echo times
Patent number
7,622,922
Issue date
Nov 24, 2009
Koninklijke Philips Electronics N.V.
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Multiple contrast echo-planar imaging for contrast-enhanced imaging
Patent number
6,804,546
Issue date
Oct 12, 2004
Koninklijke Philips Electronics, N.V.
Michael R. Thompson
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
EPI calibration method to minimize ghosting in reconstructed images
Patent number
6,700,374
Issue date
Mar 2, 2004
Koninklijke Philips Electronics, N.V.
Dee H. Wu
G01 - MEASURING TESTING
Information
Patent Grant
Multi-dimensional spatial NMR excitation
Patent number
6,541,971
Issue date
Apr 1, 2003
Koninklijke Philips Electronics, N.V.
Wayne R Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Calibration of timing delays using alternating/repeating waveforms...
Patent number
6,522,139
Issue date
Feb 18, 2003
Koninklijke Philips Electronics, N.V.
Michael R. Thompson
G01 - MEASURING TESTING
Information
Patent Grant
MRI method and apparatus for rapid acquisition of multiple views th...
Patent number
6,476,607
Issue date
Nov 5, 2002
Koninklijke Philips Electronics N.V.
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
EPI image based long term eddy current pre-emphasis calibration
Patent number
6,127,826
Issue date
Oct 3, 2000
Picker International, Inc.
Michael R. Thompson
G01 - MEASURING TESTING
Information
Patent Grant
Rotating diffusion MR imaging reduced motion artifacts
Patent number
5,833,609
Issue date
Nov 10, 1998
Picker International, Inc.
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance scan sequencer
Patent number
5,349,296
Issue date
Sep 20, 1994
Picker International, Inc.
Leonard J. Cikotte
G01 - MEASURING TESTING
Information
Patent Grant
Concurrent generation of multiple images in fast (TR<T2) scannin...
Patent number
5,311,133
Issue date
May 10, 1994
Picker International, Inc.
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Grant
Minimum basis set MR angiography
Patent number
5,034,694
Issue date
Jul 23, 1991
Picker International, Inc.
William Sattin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR ROBUST SHIMMING FOR MAGNETIC RESONANCE IMAGING
Publication number
20230243906
Publication date
Aug 3, 2023
Canon Medical Systems Corporation
Wayne Richard DANNELS
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR REDUCING ARTIFACTS IN MRI IMAGES
Publication number
20180189930
Publication date
Jul 5, 2018
TOSHIBA MEDICAL SYSTEMS CORPORATION
Wayne R. DANNELS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Accelerated MRI Using Radial Strips and Undersampling of K-Space
Publication number
20160274209
Publication date
Sep 22, 2016
Kabushiki Kaisha Toshiba
WAYNE R. DANNELS
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC RESONANCE IMAGING METHOD AND MAGNETIC RESONANCE IMAGING AP...
Publication number
20160146917
Publication date
May 26, 2016
Kabushiki Kaisha Toshiba
Andrew J. Wheaton
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC RESONANCE IMAGING APPARATUS
Publication number
20160097831
Publication date
Apr 7, 2016
Kabushiki Kaisha Toshiba
Wayne R. DANNELS
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC RESONANCE IMAGING APPARATUS AND MAGNETIC RESONANCE IMAGING...
Publication number
20150285891
Publication date
Oct 8, 2015
Kabushiki Kaisha Toshiba
WAYNE R. DANNELS
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Resonance Imaging with Consistent Geometries
Publication number
20150241537
Publication date
Aug 27, 2015
TOSHIBA MEDICAL SYSTEMS CORPORATION
WAYNE R. DANNELS
G01 - MEASURING TESTING
Information
Patent Application
MRI GHOSTING CORRECTION USING UNEQUAL MAGNITUDES RATIO
Publication number
20150061668
Publication date
Mar 5, 2015
TOSHIBA MEDICAL SYSTEMS CORPORATION
WAYNE R. DANNELS
G01 - MEASURING TESTING
Information
Patent Application
PARALLEL MRI WITH SPATIALLY MISREGISTERED SIGNAL
Publication number
20140361770
Publication date
Dec 11, 2014
WAYNE R. DANNELS
G01 - MEASURING TESTING
Information
Patent Application
MAPPING EDDY CURRENT FIELDS IN MRI SYSTEM
Publication number
20140232393
Publication date
Aug 21, 2014
TOSHIBA MEDICAL SYSTEMS CORPORATION
Andrew J. Wheaton
G01 - MEASURING TESTING
Information
Patent Application
SPATIALLY SHAPED PRE-SATURATION PROFILE FOR ENHANCED NON-CONTRAST MRA
Publication number
20120293172
Publication date
Nov 22, 2012
TOSHIBA MEDICAL SYSTEMS CORPORATION
Andrew J. Wheaton
G01 - MEASURING TESTING
Information
Patent Application
PULSED ASL USING TAGGING PULSE PATTERN ENCODING/DECODING OF FLOWING...
Publication number
20120293171
Publication date
Nov 22, 2012
TOSHIBA MEDICAL SYSTEMS CORPORATION
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Application
SPATIAL INTENSITY CORRECTION FOR RF SHADING NON-UNIFORMITIES IN MRI
Publication number
20120032677
Publication date
Feb 9, 2012
TOSHIBA MEDICAL SYSTEMS CORPORATION
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Application
Spatial intensity correction for RF shading non-uniformities in MRI
Publication number
20120032676
Publication date
Feb 9, 2012
TOSHIBA MEDICAL SYSTEMS CORPORATION
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for designing and/or implementing variable fli...
Publication number
20110181282
Publication date
Jul 28, 2011
KABUSHIKI KAISHA TOSHIBA
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Application
B1 and/or B0 mapping in MRI system using k-space spatial frequency...
Publication number
20100239151
Publication date
Sep 23, 2010
KABUSHIKI KAISHA TOSHIBA
Wayne R. Dannels
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
B1 mapping in MRI system using k-space spatial frequency domain fil...
Publication number
20100239142
Publication date
Sep 23, 2010
Kabushiki Kaisha Toshiba
Wayne R. Dannels
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
READOUT ORDERING IN COLLECTION OF RADIAL MAGNETIC RESONANCE IMAGING...
Publication number
20090140734
Publication date
Jun 4, 2009
Koninklijke Philips Electronics N.V.
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Application
SIMULTANEOUS MRI IMAGING OF MULTIPLE SUBJECTS
Publication number
20090128152
Publication date
May 21, 2009
Koninklijke Philips Electronics N.V.
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Application
Method of Motion Correction for Dynamic Volume Alignment Without Ti...
Publication number
20090116761
Publication date
May 7, 2009
Koninklijke Philips Electronics N.V.
Andrew J. Wheaton
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Locally Adaptive Nonlinear Noise Reduction
Publication number
20080310695
Publication date
Dec 18, 2008
Stephen J. Garnier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Magnetic Resonance Imaging with Short Echo Times
Publication number
20080265885
Publication date
Oct 30, 2008
Koninklijke Philips Electronics N.V.
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED SYSTEM OF MRI RF LOOP COILS PLUS SPACING FIXTURES WITH B...
Publication number
20080211498
Publication date
Sep 4, 2008
Koninklijke Philips Electronics N.V.
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Resonance Imaging With Adjustment for Magnetic Resonance D...
Publication number
20080068014
Publication date
Mar 20, 2008
Koninklijke Philips Electronics N.V.
Wayne R. Dannels
G01 - MEASURING TESTING
Information
Patent Application
Dynamic Shimset Calibration for Bo Offset
Publication number
20070279060
Publication date
Dec 6, 2007
Koninklijke Philips Electronics N.V.
Wayne R. Dannels
G01 - MEASURING TESTING