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Wee Sun Voon
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Bayan Lepas, MY
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last 30 patents
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Patent Application
Segmented Boundary Scan Chain Testing
Publication number
20240353490
Publication date
Oct 24, 2024
Ee Mei Ooi
G01 - MEASURING TESTING
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Patent Application
Techniques For Testing Input And Output Buffer Circuits Using A Tes...
Publication number
20240319262
Publication date
Sep 26, 2024
Altera Corporation
Pai Ho Bong
G01 - MEASURING TESTING