Weerakiat Wahawisan

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Carrollton, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for inspecting bumped wafers
- Patent number 6,765,666
- Issue date Jul 20, 2004
- Semiconductor Technologies & Instruments, Inc.
- Clyde Maxwell Guest
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a workpiece
- Patent number 6,118,540
- Issue date Sep 12, 2000
- Semiconductor Technologies & Instruments, Inc.
- Rajiv Roy
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method for leads of semiconductor devices
- Patent number 5,956,134
- Issue date Sep 21, 1999
- Semiconductor Technologies & Instruments, Inc.
- Rajiv Roy
- G01 - MEASURING TESTING
Information Patent Grant
Programmable lead conditioner
- Patent number 5,777,886
- Issue date Jul 7, 1998
- Semiconductor Technologies & Instruments, Inc.
- Michael D. Glucksman
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and system for inspecting integrated circuit lead burrs
- Patent number 5,745,593
- Issue date Apr 28, 1998
- Semiconductor Technologies & Instruments, Inc.
- Weerakiat Wahawisan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for bump height measurement
- Publication number 20040086198
- Publication date May 6, 2004
- Gerald Brown
- G06 - COMPUTING CALCULATING COUNTING