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Wei-Chao Ni
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Foxboro, MA, US
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Patents Grants
last 30 patents
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Patent Grant
Stabilization of particles and reduction of sample discordance in i...
Patent number
6,756,234
Issue date
Jun 29, 2004
Bayer Corporation
Wei-Chao Ni
G01 - MEASURING TESTING
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Patent Grant
Stabilization of particles and reduction of sample discordance in i...
Patent number
6,461,874
Issue date
Oct 8, 2002
Bayer Corporation
Wei-Chao Ni
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Stabilization of particles and reduction of sample discordance in i...
Publication number
20020090638
Publication date
Jul 11, 2002
Wei-Chao Ni
G01 - MEASURING TESTING