Wei-Chi Ku

Person

Taipei, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Display apparatus
- Patent number 12,094,887
- Issue date Sep 17, 2024
- E Ink Holdings Inc.
- Chia-Chi Chang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Display apparatus
- Patent number 11,695,018
- Issue date Jul 4, 2023
- E Ink Holdings Inc.
- Chia-Chi Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display panel
- Patent number 11,615,725
- Issue date Mar 28, 2023
- E Ink Holdings Inc.
- Chia-Chi Chang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Probing apparatus
- Patent number 11,536,765
- Issue date Dec 27, 2022
- MPI CORPORATION
- Kang-Yen Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Offset cancellation voltage latch sense amplifier for non-volatile...
- Patent number 11,295,788
- Issue date Apr 5, 2022
- Ememory Technology Inc.
- Wei-Ming Ku
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory with multi-level cell array and associated read...
- Patent number 11,264,092
- Issue date Mar 1, 2022
- eMemory Technology Inc.
- Chia-Fu Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Programming and verifying method for multilevel memory cell array
- Patent number 11,250,921
- Issue date Feb 15, 2022
- eMemory Technology Inc.
- Ying-Je Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Random bit cell using P-type transistors
- Patent number 11,101,798
- Issue date Aug 24, 2021
- eMemory Technology Inc.
- Ying-Je Chen
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Random code generator with floating gate transistor type memory cell
- Patent number 10,985,758
- Issue date Apr 20, 2021
- eMemory Technology Inc.
- Wei-Ming Ku
- G05 - CONTROLLING REGULATING
Information Patent Grant
Voltage control device applied in a memory system
- Patent number 10,693,369
- Issue date Jun 23, 2020
- eMemory Technology Inc.
- Wei-Ming Ku
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe module supporting loopback test
- Patent number 10,295,567
- Issue date May 21, 2019
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Power switch circuit
- Patent number 10,121,550
- Issue date Nov 6, 2018
- eMemory Technology Inc.
- Chih-Yang Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Probe module with high stability
- Patent number 10,101,362
- Issue date Oct 16, 2018
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Power switch circuit for non-volatile memory
- Patent number 10,096,368
- Issue date Oct 9, 2018
- eMemory Technology Inc.
- Chih-Yang Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Multilayer circuit board
- Patent number 10,070,512
- Issue date Sep 4, 2018
- Wei-Cheng Ku
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe card capable of transmitting high-frequency signals
- Patent number 10,067,163
- Issue date Sep 4, 2018
- MPI CORPORATION
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Testing jig
- Patent number 10,054,627
- Issue date Aug 21, 2018
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Synchronization controller for multi-sensor camera device and relat...
- Patent number 10,033,989
- Issue date Jul 24, 2018
- Mediatek Inc.
- Tung-Hai Wu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Probe card having configurable structure for exchanging or swapping...
- Patent number 9,927,487
- Issue date Mar 27, 2018
- MPI Corporation
- Chao-Ching Huang
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating and debugging testing system
- Patent number 9,880,252
- Issue date Jan 30, 2018
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever type probe card for high frequency signal transmission
- Patent number 9,835,651
- Issue date Dec 5, 2017
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probe module
- Patent number 9,759,746
- Issue date Sep 12, 2017
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Testing system and method for testing of electrical connections
- Patent number 9,759,743
- Issue date Sep 12, 2017
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probe card capable of transmitting high-frequency signals
- Patent number 9,658,249
- Issue date May 23, 2017
- MPI CORPORATION
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Method of operating testing system
- Patent number 9,645,197
- Issue date May 9, 2017
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Multilayer circuit board
- Patent number 9,622,348
- Issue date Apr 11, 2017
- MPI Corporation
- Wei-Cheng Ku
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multilayer circuit board
- Patent number 9,596,769
- Issue date Mar 14, 2017
- MPI Corporation
- Wei-Cheng Ku
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of calibrating and debugging testing system
- Patent number 9,581,676
- Issue date Feb 28, 2017
- MPI CORPORATION
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Multilayer circuit board
- Patent number 9,545,002
- Issue date Jan 10, 2017
- MPI Corporation
- Wei-Cheng Ku
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electrical testing device
- Patent number 9,523,708
- Issue date Dec 20, 2016
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSE AMPLIFIER APPLIED TO NON-VOLATILE MEMORY
- Publication number 20240420745
- Publication date Dec 19, 2024
- EMEMORY TECHNOLOGY INC.
- Wei-Ming KU
- G11 - INFORMATION STORAGE
Information Patent Application
PROBE HEAD HAVING SPRING PROBES
- Publication number 20240118313
- Publication date Apr 11, 2024
- MPI Corporation
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
MEMORY CELL AND ARRAY STRUCTURE OF NON-VOLATILE MEMORY AND ASSOCIAT...
- Publication number 20230290414
- Publication date Sep 14, 2023
- EMEMORY TECHNOLOGY INC.
- Wei-Ming KU
- G11 - INFORMATION STORAGE
Information Patent Application
DISPLAY APPARATUS
- Publication number 20230282652
- Publication date Sep 7, 2023
- E Ink Holdings Inc.
- Chia-Chi CHANG
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
DISPLAY PANEL
- Publication number 20210375172
- Publication date Dec 2, 2021
- E Ink Holdings Inc.
- Chia-Chi Chang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
NON-VOLATILE MEMORY WITH MULTI-LEVEL CELL ARRAY AND ASSOCIATED READ...
- Publication number 20210358543
- Publication date Nov 18, 2021
- EMEMORY TECHNOLOGY INC.
- Chia-Fu CHANG
- G11 - INFORMATION STORAGE
Information Patent Application
OFFSET CANCELLATION VOLTAGE LATCH SENSE AMPLIFIER FOR NON-VOLATILE...
- Publication number 20210050039
- Publication date Feb 18, 2021
- Ememory Technology Inc.
- Wei-Ming KU
- G11 - INFORMATION STORAGE
Information Patent Application
DISPLAY APPARATUS
- Publication number 20200411561
- Publication date Dec 31, 2020
- E Ink Holdings Inc.
- Chia-Chi CHANG
- G02 - OPTICS
Information Patent Application
PROBING APPARATUS
- Publication number 20200400740
- Publication date Dec 24, 2020
- MPI Corporation
- Kang-Yen Fu
- G01 - MEASURING TESTING
Information Patent Application
RANDOM BIT CELL USING P-TYPE TRANSISTORS
- Publication number 20200327945
- Publication date Oct 15, 2020
- EMEMORY TECHNOLOGY INC.
- Ying-Je Chen
- G11 - INFORMATION STORAGE
Information Patent Application
RANDOM CODE GENERATOR WITH FLOATING GATE TRANSISTOR TYPE MEMORY CELL
- Publication number 20200327946
- Publication date Oct 15, 2020
- EMEMORY TECHNOLOGY INC.
- Wei-Ming KU
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE CONTROL DEVICE APPLIED IN A MEMORY SYSTEM
- Publication number 20190372456
- Publication date Dec 5, 2019
- EMEMORY TECHNOLOGY INC.
- Wei-Ming Ku
- G05 - CONTROLLING REGULATING
Information Patent Application
POWER SWITCH CIRCUIT FOR NON-VOLATILE MEMORY
- Publication number 20180261294
- Publication date Sep 13, 2018
- EMEMORY TECHNOLOGY INC.
- Chih-Yang Huang
- G11 - INFORMATION STORAGE
Information Patent Application
POWER SWITCH CIRCUIT
- Publication number 20170206976
- Publication date Jul 20, 2017
- EMEMORY TECHNOLOGY INC.
- Chih-Yang Huang
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF CALIBRATING AND DEBUGGING TESTING SYSTEM
- Publication number 20170146634
- Publication date May 25, 2017
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER CIRCUIT BOARD
- Publication number 20170150592
- Publication date May 25, 2017
- MPI Corporation
- WEI-CHENG KU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE MODULE
- Publication number 20170115326
- Publication date Apr 27, 2017
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD CAPABLE OF TRANSMITTING HIGH-FREQUENCY SIGNALS
- Publication number 20170059613
- Publication date Mar 2, 2017
- MPI Corporation
- Wei-Cheng KU
- G01 - MEASURING TESTING
Information Patent Application
PROBE MODULE SUPPORTING LOOPBACK TEST
- Publication number 20170003319
- Publication date Jan 5, 2017
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
Probe Card
- Publication number 20160305981
- Publication date Oct 20, 2016
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
HIGH-FREQUENCY CANTILEVER TYPE PROBE CARD
- Publication number 20160139179
- Publication date May 19, 2016
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER CIRCUIT BOARD
- Publication number 20160143141
- Publication date May 19, 2016
- MPI CORPORATION
- WEI-CHENG KU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MULTILAYER CIRCUIT BOARD
- Publication number 20160128176
- Publication date May 5, 2016
- MPI CORPORATION
- WEI-CHENG KU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTU...
- Publication number 20160018441
- Publication date Jan 21, 2016
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTU...
- Publication number 20160018439
- Publication date Jan 21, 2016
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALIBRATING AND DEBUGGING TESTING SYSTEM
- Publication number 20150241544
- Publication date Aug 27, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
Testing system and method for testing of electrical connections
- Publication number 20150233969
- Publication date Aug 20, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALIBRATING AND OPERATING TESTING SYSTEM
- Publication number 20150212186
- Publication date Jul 30, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
TESTING JIG
- Publication number 20150204905
- Publication date Jul 23, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
TESTING JIG
- Publication number 20150204906
- Publication date Jul 23, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Display apparatus

Display apparatus

Display panel

Probing apparatus

Offset cancellation voltage latch sense amplifier for non-volatile...

Non-volatile memory with multi-level cell array and associated read...

Programming and verifying method for multilevel memory cell array

Random bit cell using P-type transistors

Random code generator with floating gate transistor type memory cell

Voltage control device applied in a memory system

Probe module supporting loopback test

Power switch circuit

Probe module with high stability

Power switch circuit for non-volatile memory

Multilayer circuit board

Probe card capable of transmitting high-frequency signals

Testing jig

Synchronization controller for multi-sensor camera device and relat...

Probe card having configurable structure for exchanging or swapping...

Method of calibrating and debugging testing system

Cantilever type probe card for high frequency signal transmission

Probe module

Testing system and method for testing of electrical connections

Probe card capable of transmitting high-frequency signals

Method of operating testing system

Multilayer circuit board

Multilayer circuit board

Method of calibrating and debugging testing system

Multilayer circuit board

Electrical testing device

Patents Applicationslast 30 patents

SENSE AMPLIFIER APPLIED TO NON-VOLATILE MEMORY

PROBE HEAD HAVING SPRING PROBES

MEMORY CELL AND ARRAY STRUCTURE OF NON-VOLATILE MEMORY AND ASSOCIAT...

DISPLAY APPARATUS

DISPLAY PANEL

NON-VOLATILE MEMORY WITH MULTI-LEVEL CELL ARRAY AND ASSOCIATED READ...

OFFSET CANCELLATION VOLTAGE LATCH SENSE AMPLIFIER FOR NON-VOLATILE...

DISPLAY APPARATUS

PROBING APPARATUS

RANDOM BIT CELL USING P-TYPE TRANSISTORS

RANDOM CODE GENERATOR WITH FLOATING GATE TRANSISTOR TYPE MEMORY CELL

VOLTAGE CONTROL DEVICE APPLIED IN A MEMORY SYSTEM

POWER SWITCH CIRCUIT FOR NON-VOLATILE MEMORY

POWER SWITCH CIRCUIT

METHOD OF CALIBRATING AND DEBUGGING TESTING SYSTEM

MULTILAYER CIRCUIT BOARD

PROBE MODULE

PROBE CARD CAPABLE OF TRANSMITTING HIGH-FREQUENCY SIGNALS

PROBE MODULE SUPPORTING LOOPBACK TEST

Probe Card

HIGH-FREQUENCY CANTILEVER TYPE PROBE CARD

MULTILAYER CIRCUIT BOARD

MULTILAYER CIRCUIT BOARD

PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTU...

PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTU...

METHOD OF CALIBRATING AND DEBUGGING TESTING SYSTEM

Testing system and method for testing of electrical connections

METHOD OF CALIBRATING AND OPERATING TESTING SYSTEM

TESTING JIG

TESTING JIG