Wei-Chun HUNG

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Non-contact measurement of a stress in a film on substrate
- Patent number 11,105,611
- Issue date Aug 31, 2021
- APPLEJACK 199 L.P.
- Wojciech J Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Characterization of specular surfaces
- Patent number 10,621,739
- Issue date Apr 14, 2020
- APPLEJACK 199 L.P.
- Wojciech J Walecki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARACTERIZATION OF SPECULAR SURFACES
- Publication number 20200320724
- Publication date Oct 8, 2020
- Applejack 199 L.P.
- Wojciech J WALECKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-CONTACT MEASUREMENT OF A STRESS IN A FILM ON SUBSTRATE
- Publication number 20190353475
- Publication date Nov 21, 2019
- Applejack 199 L.P.
- Wojciech J. WALECKI
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION OF SPECULAR SURFACES
- Publication number 20190304110
- Publication date Oct 3, 2019
- Applejack 199 L.P.
- Wojciech J WALECKI
- G01 - MEASURING TESTING