Wei-Chung Su

Person

Taichung County, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Vertical probe card device and fence-like probe thereof
- Patent number 12,203,961
- Issue date Jan 21, 2025
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card and probe module thereof
- Patent number 12,181,496
- Issue date Dec 31, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card having different probes
- Patent number 12,146,897
- Issue date Nov 19, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Modular vertical probe card
- Patent number 12,111,336
- Issue date Oct 8, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card device and elastic probe thereof
- Patent number 12,092,661
- Issue date Sep 17, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card and fence-like probe thereof
- Patent number 11,988,686
- Issue date May 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card device and focusing probe thereof
- Patent number 11,913,973
- Issue date Feb 27, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card and carrier thereof
- Patent number 11,879,912
- Issue date Jan 23, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Board-like connector, single-arm bridge of board-like connector, an...
- Patent number 11,747,395
- Issue date Sep 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Board-like connector, dual-arm bridge of board-like connector, and...
- Patent number 11,699,871
- Issue date Jul 11, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card device and self-aligned probe
- Patent number 11,592,466
- Issue date Feb 28, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Board-like connector, dual-ring bridge of board-like connector, and...
- Patent number 11,561,244
- Issue date Jan 24, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and dual-arm probe
- Patent number 11,536,744
- Issue date Dec 27, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and disposable adjustment film thereof
- Patent number 11,506,685
- Issue date Nov 22, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card device and spring-like probe
- Patent number 11,460,486
- Issue date Oct 4, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and fence-like probe thereof
- Patent number 11,226,354
- Issue date Jan 18, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and neck-like probe thereof
- Patent number 11,209,461
- Issue date Dec 28, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device
- Patent number 11,204,371
- Issue date Dec 21, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Staggered probe card
- Patent number 11,175,312
- Issue date Nov 16, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device
- Patent number 11,073,537
- Issue date Jul 27, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and rectangular probe thereof
- Patent number 11,041,883
- Issue date Jun 22, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Chih-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and three-dimensional signal transfer structure t...
- Patent number 11,009,526
- Issue date May 18, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and probe head
- Patent number 10,901,001
- Issue date Jan 26, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Chih-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device
- Patent number 10,845,385
- Issue date Nov 24, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and rectangular probe
- Patent number 10,670,630
- Issue date Jun 2, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Chih-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly and capacitive space transformer thereof
- Patent number 10,615,768
- Issue date Apr 7, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Chih-Peng Hsieh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Probe card device and rectangular probe thereof
- Patent number 10,613,117
- Issue date Apr 7, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Yen-Chen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and rectangular probe thereof having ring-shaped...
- Patent number 10,605,830
- Issue date Mar 31, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Chih-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly and probe structure thereof
- Patent number 10,509,057
- Issue date Dec 17, 2019
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and rectangular probe thereof
- Patent number 10,401,388
- Issue date Sep 3, 2019
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE
- Publication number 20240385223
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE
- Publication number 20240385217
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND MICRO ELECTRO MECHANICAL SYSTEM (M...
- Publication number 20240385218
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND LIGHT SCATTERING PROBE
- Publication number 20240385219
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE
- Publication number 20240385221
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND CANTILEVER PROBE MODULE
- Publication number 20240385222
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF
- Publication number 20240377436
- Publication date Nov 14, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- YU-JU LU
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF
- Publication number 20240377437
- Publication date Nov 14, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- YU-JU LU
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD AND CARRIER THEREOF
- Publication number 20230349948
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND ELASTIC PROBE THEREOF
- Publication number 20230349952
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND FOCUSING PROBE THEREOF
- Publication number 20230349951
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD AND PROBE MODULE THEREOF
- Publication number 20230349953
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF
- Publication number 20230314480
- Publication date Oct 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD HAVING DIFFERENT PROBES
- Publication number 20230314477
- Publication date Oct 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
MODULAR VERTICAL PROBE CARD
- Publication number 20230314481
- Publication date Oct 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD AND FENCE-LIKE PROBE THEREOF
- Publication number 20230314478
- Publication date Oct 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND DISPOSABLE ADJUSTMENT FILM THEREOF
- Publication number 20220365110
- Publication date Nov 17, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD DEVICE AND SPRING-LIKE PROBE
- Publication number 20220334145
- Publication date Oct 20, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND DUAL-ARM PROBE
- Publication number 20220170960
- Publication date Jun 2, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND SELF-ALIGNED PROBE
- Publication number 20220163565
- Publication date May 26, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
BOARD-LIKE CONNECTOR, SINGLE-ARM BRIDGE OF BOARD-LIKE CONNECTOR, AN...
- Publication number 20220137124
- Publication date May 5, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BOARD-LIKE CONNECTOR, DUAL-RING BRIDGE OF BOARD-LIKE CONNECTOR, AND...
- Publication number 20220137095
- Publication date May 5, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
BOARD-LIKE CONNECTOR, DUAL-ARM BRIDGE OF BOARD-LIKE CONNECTOR, AND...
- Publication number 20220140515
- Publication date May 5, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF
- Publication number 20220018876
- Publication date Jan 20, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND FAN-OUT PROBE THEREOF
- Publication number 20220011346
- Publication date Jan 13, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND DIRECTIVITY PROBE THEREOF
- Publication number 20210223291
- Publication date Jul 22, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND NECK-LIKE PROBE THEREOF
- Publication number 20210223289
- Publication date Jul 22, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
STAGGERED PROBE CARD AND CONDUCTIVE PROBE
- Publication number 20210109129
- Publication date Apr 15, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND CONDUCTIVE PROBE THEREOF
- Publication number 20200300893
- Publication date Sep 24, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND FLAT SIGNAL TRANSFER STRUCTURE THEREOF
- Publication number 20190377003
- Publication date Dec 12, 2019
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING

Wei-Chung Su

Person

Patents Grantslast 30 patents

Vertical probe card device and fence-like probe thereof

Cantilever probe card and probe module thereof

Vertical probe card having different probes

Modular vertical probe card

Cantilever probe card device and elastic probe thereof

Vertical probe card and fence-like probe thereof

Cantilever probe card device and focusing probe thereof

Cantilever probe card and carrier thereof

Board-like connector, single-arm bridge of board-like connector, an...

Board-like connector, dual-arm bridge of board-like connector, and...

Probe card device and self-aligned probe

Board-like connector, dual-ring bridge of board-like connector, and...

Probe card device and dual-arm probe

Probe card device and disposable adjustment film thereof

Probe card device and spring-like probe

Probe card device and fence-like probe thereof

Probe card device and neck-like probe thereof

Probe card device

Staggered probe card

Probe card device

Probe card device and rectangular probe thereof

Probe card device and three-dimensional signal transfer structure t...

Probe card device and probe head

Probe card device

Probe card device and rectangular probe

Probe assembly and capacitive space transformer thereof

Probe card device and rectangular probe thereof

Probe card device and rectangular probe thereof having ring-shaped...

Probe assembly and probe structure thereof

Probe card device and rectangular probe thereof

Patents Applicationslast 30 patents

CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE

CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE

CANTILEVER PROBE CARD DEVICE AND MICRO ELECTRO MECHANICAL SYSTEM (M...

CANTILEVER PROBE CARD DEVICE AND LIGHT SCATTERING PROBE

CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE

CANTILEVER PROBE CARD DEVICE AND CANTILEVER PROBE MODULE

PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF

VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF

CANTILEVER PROBE CARD AND CARRIER THEREOF

CANTILEVER PROBE CARD DEVICE AND ELASTIC PROBE THEREOF

CANTILEVER PROBE CARD DEVICE AND FOCUSING PROBE THEREOF

CANTILEVER PROBE CARD AND PROBE MODULE THEREOF

VERTICAL PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF

VERTICAL PROBE CARD HAVING DIFFERENT PROBES

MODULAR VERTICAL PROBE CARD

VERTICAL PROBE CARD AND FENCE-LIKE PROBE THEREOF

PROBE CARD DEVICE AND DISPOSABLE ADJUSTMENT FILM THEREOF

PROBE CARD DEVICE AND SPRING-LIKE PROBE

PROBE CARD DEVICE AND DUAL-ARM PROBE

PROBE CARD DEVICE AND SELF-ALIGNED PROBE

BOARD-LIKE CONNECTOR, SINGLE-ARM BRIDGE OF BOARD-LIKE CONNECTOR, AN...

BOARD-LIKE CONNECTOR, DUAL-RING BRIDGE OF BOARD-LIKE CONNECTOR, AND...

BOARD-LIKE CONNECTOR, DUAL-ARM BRIDGE OF BOARD-LIKE CONNECTOR, AND...

PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF

PROBE CARD DEVICE AND FAN-OUT PROBE THEREOF

PROBE CARD DEVICE AND DIRECTIVITY PROBE THEREOF

PROBE CARD DEVICE AND NECK-LIKE PROBE THEREOF

STAGGERED PROBE CARD AND CONDUCTIVE PROBE

PROBE CARD DEVICE AND CONDUCTIVE PROBE THEREOF

PROBE CARD DEVICE AND FLAT SIGNAL TRANSFER STRUCTURE THEREOF