Wei Feig Qu

Person

Gunma, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for manufacturing silicon single crystal wafer and silicon s...
- Patent number 11,959,191
- Issue date Apr 16, 2024
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng Qu
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for heat-treating silicon single crystal wafer
- Patent number 11,408,092
- Issue date Aug 9, 2022
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng Qu
- C30 - CRYSTAL GROWTH
Information Patent Grant
Silicon wafer heat treatment method
- Patent number 9,708,726
- Issue date Jul 18, 2017
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng Qu
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for detecting crystal defects
- Patent number 9,606,030
- Issue date Mar 28, 2017
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng Qu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing silicon single crystal wafer and annealed...
- Patent number 8,916,953
- Issue date Dec 23, 2014
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng Qu
- C30 - CRYSTAL GROWTH
Information Patent Grant
Bonded substrate and manufacturing method thereof
- Patent number 8,900,971
- Issue date Dec 2, 2014
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing bonded substrate having an insulator layer...
- Patent number 8,877,609
- Issue date Nov 4, 2014
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor substrate having multilayer film and method to reuse...
- Patent number 8,575,722
- Issue date Nov 5, 2013
- Shin-Etsu Handotai Co., Ltd.
- Kiyoshi Mitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing annealed wafer and annealed wafer
- Patent number 7,189,293
- Issue date Mar 13, 2007
- Shin-Etsu Handotai Co., Ltd.
- Norihiro Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing annealed wafer and annealed wafer
- Patent number 7,153,785
- Issue date Dec 26, 2006
- Shin-Etsu Handotai Co., Ltd.
- Norihiro Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing silicon wafer and silicon wafer
- Patent number 7,147,711
- Issue date Dec 12, 2006
- Shin-Etsu Handotai Co., Ltd.
- Masaro Tamatsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon wafer and silicon epitaxial wafer and production methods th...
- Patent number 6,858,094
- Issue date Feb 22, 2005
- Shin-Etsu Handotai Co., Ltd.
- Wei Feig Qu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Annealed wafer manufacturing method and annealed wafer
- Patent number 6,841,450
- Issue date Jan 11, 2005
- Shin-Etsu Handotai Co., Ltd.
- Norihiro Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MANUFACTURING SILICON SINGLE CRYSTAL WAFER AND SILICON S...
- Publication number 20220195620
- Publication date Jun 23, 2022
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng QU
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR HEAT-TREATING SILICON SINGLE CRYSTAL WAFER
- Publication number 20210062366
- Publication date Mar 4, 2021
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng QU
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR HEAT-TREATING SILICON SINGLE CRYSTAL WAFER
- Publication number 20170253995
- Publication date Sep 7, 2017
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng QU
- C30 - CRYSTAL GROWTH
Information Patent Application
SILICON WAFER HEAT TREATMENT METHOD
- Publication number 20160130718
- Publication date May 12, 2016
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng QU
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD OF MANUFACTURING SOI WAFER
- Publication number 20150287630
- Publication date Oct 8, 2015
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng Qu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTING CRYSTAL DEFECTS
- Publication number 20140119399
- Publication date May 1, 2014
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng Qu
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING BONDED SUBSTRATE HAVING AN INSULATOR LAYER...
- Publication number 20140120695
- Publication date May 1, 2014
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BONDED SUBSTRATE AND MANUFACTURING METHOD THEREOF
- Publication number 20130341763
- Publication date Dec 26, 2013
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SILICON SINGLE CRYSTAL WAFER AND ANNEALED...
- Publication number 20130264685
- Publication date Oct 10, 2013
- Shin-Etsu Handotai Co., Ltd.
- Wei Feng Qu
- C30 - CRYSTAL GROWTH
Information Patent Application
SEMICONDUCTOR WAFER HAVING MULTILAYER FILM, METHOD FOR PRODUCING TH...
- Publication number 20110266655
- Publication date Nov 3, 2011
- Shin-Etsu Handotai Co., Ltd.
- Kiyoshi Mitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Producing Silicon Wafer
- Publication number 20090197396
- Publication date Aug 6, 2009
- Shin-Etsu Handotai Co., Ltd.
- Wei Feig Qu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Production method for anneal wafer and anneal wafer
- Publication number 20040231759
- Publication date Nov 25, 2004
- Norihiro Kobayashi
- C30 - CRYSTAL GROWTH
Information Patent Application
Production method for anneal wafer and anneal wafer
- Publication number 20040192071
- Publication date Sep 30, 2004
- Norihiro Kobayashi
- C30 - CRYSTAL GROWTH
Information Patent Application
Method of producing silicon wafer and silicon wafer
- Publication number 20040003769
- Publication date Jan 8, 2004
- Masaro Tamatsuka
- C30 - CRYSTAL GROWTH
Information Patent Application
Silicon wafer and silicon epitaxial wafer and producition methods t...
- Publication number 20040005777
- Publication date Jan 8, 2004
- Wei Freig Qu
- C30 - CRYSTAL GROWTH
Information Patent Application
Method of producing anneal wafer and anneal wafer
- Publication number 20020173173
- Publication date Nov 21, 2002
- Norihiro Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS

Wei Feig Qu

Person

Patents Grantslast 30 patents

Method for manufacturing silicon single crystal wafer and silicon s...

Method for heat-treating silicon single crystal wafer

Silicon wafer heat treatment method

Method for detecting crystal defects

Method for manufacturing silicon single crystal wafer and annealed...

Bonded substrate and manufacturing method thereof

Method for manufacturing bonded substrate having an insulator layer...

Semiconductor substrate having multilayer film and method to reuse...

Method of producing annealed wafer and annealed wafer

Method of producing annealed wafer and annealed wafer

Method of producing silicon wafer and silicon wafer

Silicon wafer and silicon epitaxial wafer and production methods th...

Annealed wafer manufacturing method and annealed wafer

Patents Applicationslast 30 patents

METHOD FOR MANUFACTURING SILICON SINGLE CRYSTAL WAFER AND SILICON S...

METHOD FOR HEAT-TREATING SILICON SINGLE CRYSTAL WAFER

METHOD FOR HEAT-TREATING SILICON SINGLE CRYSTAL WAFER

SILICON WAFER HEAT TREATMENT METHOD

METHOD OF MANUFACTURING SOI WAFER

METHOD FOR DETECTING CRYSTAL DEFECTS

METHOD FOR MANUFACTURING BONDED SUBSTRATE HAVING AN INSULATOR LAYER...

BONDED SUBSTRATE AND MANUFACTURING METHOD THEREOF

METHOD FOR MANUFACTURING SILICON SINGLE CRYSTAL WAFER AND ANNEALED...

SEMICONDUCTOR WAFER HAVING MULTILAYER FILM, METHOD FOR PRODUCING TH...

Method for Producing Silicon Wafer

Production method for anneal wafer and anneal wafer

Production method for anneal wafer and anneal wafer

Method of producing silicon wafer and silicon wafer

Silicon wafer and silicon epitaxial wafer and producition methods t...

Method of producing anneal wafer and anneal wafer