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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Charged particle beam apparatus
Patent number
12,169,182
Issue date
Dec 17, 2024
HITACHI HIGH-TECH CORPORATION
Wei Chean Tan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charged particle beam device
Patent number
12,051,563
Issue date
Jul 30, 2024
HITACHI HIGH-TECH CORPORATION
Ryo Komatsuzaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device
Patent number
12,046,446
Issue date
Jul 23, 2024
HITACHI HIGH-TECH CORPORATION
Hiroyuki Chiba
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charged particle beam apparatus
Patent number
11,747,292
Issue date
Sep 5, 2023
HITACHI HIGH-TECH CORPORATION
Wei Chean Tan
G01 - MEASURING TESTING
Information
Patent Grant
Planar lipid bilayer array formed by microfluidic technique and met...
Patent number
8,513,165
Issue date
Aug 20, 2013
The University of Tokyo
Shoji Takeuchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Lamella Mounting Method, and Analysis System
Publication number
20240412941
Publication date
Dec 12, 2024
Hitachi High-Tech Corporation
Wei Chean TAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Position Specification Method, Position Specification Program, and...
Publication number
20240304563
Publication date
Sep 12, 2024
Hitachi High-Tech Corporation
Liang LI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Charged Particle Beam Apparatus
Publication number
20230366841
Publication date
Nov 16, 2023
HITACHI HIGH-TECH CORPORATION
Wei Chean TAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Charged Particle Beam Apparatus and Focus Adjusting Method Therefor
Publication number
20230230798
Publication date
Jul 20, 2023
Hitachi High-Tech Corporation
Keisuke IGARASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device
Publication number
20230178331
Publication date
Jun 8, 2023
Hitachi High-Tech Corporation
Mai YOSHIHARA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device
Publication number
20220344124
Publication date
Oct 27, 2022
Hitachi High-Tech Corporation
Hiroyuki CHIBA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Sample Image Display System and Charged Particle Beam Apparatus
Publication number
20220336184
Publication date
Oct 20, 2022
Hitachi High-Tech Corporation
Wei Chean TAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device
Publication number
20220301813
Publication date
Sep 22, 2022
Hitachi High-Tech Corporation
Ryo KOMATSUZAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Apparatus
Publication number
20210383519
Publication date
Dec 9, 2021
Hitachi High-Tech Corporation
Wei Chean TAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PLANAR LIPID BILAYER ARRAY FORMED BY MICROFLUIDIC TECHNIQUE AND MET...
Publication number
20100304980
Publication date
Dec 2, 2010
THE UNIVERSITY OF TOKYO
Shoji Takeuchi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL