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Patents Grants
last 30 patents
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Patent Grant
High voltage semiconductor test system with multiple sites for use...
Patent number
11,460,501
Issue date
Oct 4, 2022
Silicon Laboratories Inc.
Wenshui Zhang
G01 - MEASURING TESTING
Information
Patent Grant
System and method of production testing of impedance of radio frequ...
Patent number
11,226,371
Issue date
Jan 18, 2022
Silicon Laboratories Inc.
Yuwono Kurnia Rahman
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
HIGH VOLTAGE SEMICONDUCTOR TEST SYSTEM WITH MULTIPLE SITES FOR USE...
Publication number
20220341989
Publication date
Oct 27, 2022
Silicon Laboratories Inc.
Wenshui Zhang
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF PRODUCTION TESTING OF IMPEDANCE OF RADIO FREQU...
Publication number
20210148973
Publication date
May 20, 2021
Silicon Laboratories Inc.
Yuwono Kurnia Rahman
G01 - MEASURING TESTING