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SANTA CLARA, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Determining profile parameters of a structure using approximation a...
Patent number
7,949,490
Issue date
May 24, 2011
Tokyo Electron Limited
Wei Liu
G01 - MEASURING TESTING
Information
Patent Grant
Data flow management in generating profile models used in optical m...
Patent number
7,783,669
Issue date
Aug 24, 2010
Tokyo Electron Limited
Hong Qiu
G01 - MEASURING TESTING
Information
Patent Grant
Data flow management in generating different signal formats used in...
Patent number
7,765,234
Issue date
Jul 27, 2010
Tokyo Electron Limited
Hong Qiu
G01 - MEASURING TESTING
Information
Patent Grant
Determining profile parameters of a structure using approximation a...
Patent number
7,729,873
Issue date
Jun 1, 2010
Tokyo Electron Limited
Wei Liu
G01 - MEASURING TESTING
Information
Patent Grant
Determining transmittance of a photomask using optical metrology
Patent number
7,639,375
Issue date
Dec 29, 2009
Tokyo Electron Limited
Sanjay Yedur
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated process control using parameters determined with approxim...
Patent number
7,627,392
Issue date
Dec 1, 2009
Tokyo Electron Limited
Wei Liu
G01 - MEASURING TESTING
Information
Patent Grant
Library accuracy enhancment and evaluation
Patent number
7,617,075
Issue date
Nov 10, 2009
Tokyo Electron Limited
Shifang Li
G01 - MEASURING TESTING
Information
Patent Grant
Parallel profile determination in optical metrology
Patent number
7,515,283
Issue date
Apr 7, 2009
Tokyo Electron, Ltd.
Tri Thanh Khuong
G01 - MEASURING TESTING
Information
Patent Grant
Parallel profile determination for an optical metrology system
Patent number
7,469,192
Issue date
Dec 23, 2008
Tokyo Electron Ltd.
Tri Thanh Khuong
G01 - MEASURING TESTING
Information
Patent Grant
Split machine learning systems
Patent number
7,421,414
Issue date
Sep 2, 2008
Timbre Technologies, Inc.
Wei Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Library accuracy enhancement and evaluation
Patent number
7,302,367
Issue date
Nov 27, 2007
Timbre Technologies, Inc.
Shifang Li
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DETERMINING PROFILE PARAMETERS OF A STRUCTURE USING APPROXIMATION A...
Publication number
20090063075
Publication date
Mar 5, 2009
TOKYO ELECTRON LIMITED
WEI LIU
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED PROCESS CONTROL USING PARAMETERS DETERMINED WITH APPROXIM...
Publication number
20090063077
Publication date
Mar 5, 2009
TOKYO ELECTRON LIMITED
WEI LIU
G05 - CONTROLLING REGULATING
Information
Patent Application
Determining profile parameters of a structure using approximation a...
Publication number
20090063076
Publication date
Mar 5, 2009
TOKYO ELECTRON LIMITED
WEI LIU
G02 - OPTICS
Information
Patent Application
Determining transmittance of a photomask using optical metrology
Publication number
20080144919
Publication date
Jun 19, 2008
TOKYO ELECTRON LIMITED
Sanjay Yedur
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Data flow management in generating profile models used in optical m...
Publication number
20080091724
Publication date
Apr 17, 2008
TOKYO ELECTRON LIMITED
Hong Qiu
G01 - MEASURING TESTING
Information
Patent Application
Data flow management in generating different signal formats used in...
Publication number
20080089574
Publication date
Apr 17, 2008
TOKYO ELECTRON LIMITED
Hong Qiu
G01 - MEASURING TESTING
Information
Patent Application
LIBRARY ACCURACY ENHANCMENT AND EVALUATION
Publication number
20080071504
Publication date
Mar 20, 2008
TIMBRE TECHNOLOGIES INC.
Shifang Li
G01 - MEASURING TESTING
Information
Patent Application
Generating a profile model to characterize a structure to be examin...
Publication number
20080013107
Publication date
Jan 17, 2008
TOKYO ELECTRON LIMITED
Jeffrey A. Chard
G01 - MEASURING TESTING
Information
Patent Application
Parallel profile determination for an optical metrology system
Publication number
20080015812
Publication date
Jan 17, 2008
TOKYO ELECTRON LIMITED
Tri Thanh Khuong
G01 - MEASURING TESTING
Information
Patent Application
Parallel profile determination in optical metrology
Publication number
20080013108
Publication date
Jan 17, 2008
TOKYO ELECTRON LIMITED
Tri Thanh Khuong
G01 - MEASURING TESTING
Information
Patent Application
Library accuracy enhancement and evaluation
Publication number
20070225940
Publication date
Sep 27, 2007
TIMBRE TECHNOLOGIES INC.
Shifang Li
G01 - MEASURING TESTING
Information
Patent Application
Split machine learning systems
Publication number
20060224528
Publication date
Oct 5, 2006
Timbre Technologies, Inc.
Wei Liu
G06 - COMPUTING CALCULATING COUNTING