Wei-Pin Changchein

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Taichung City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for diagnosing an integrated circuit
- Patent number 8,516,316
- Issue date Aug 20, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tong Kin Lam
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for clock skew compensation in voltage scaling
- Patent number 7,746,142
- Issue date Jun 29, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Pin Changchein
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Diagnosing an Integrated Circuit
- Publication number 20100244853
- Publication date Sep 30, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kin Lam Tong
- G01 - MEASURING TESTING
Information Patent Application
Circuit and Method for Clock Skew Compensation in Voltage Scaling
- Publication number 20100090738
- Publication date Apr 15, 2010
- Wei-Pin Changchein
- G06 - COMPUTING CALCULATING COUNTING