WEI-PIN CHANGCHIEN

Person

TAICHUNG CITY, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Machine-learning design enablement platform
- Patent number 11,017,149
- Issue date May 25, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yi-Lin Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method to diagnose integrated circuit
- Patent number 10,866,281
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Wei-Pin Changchien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine-learning design enablement platform
- Patent number 10,678,973
- Issue date Jun 9, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yi-Lin Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method to diagnose integrated circuit
- Patent number 10,267,853
- Issue date Apr 23, 2019
- Taiwan Semiconductor Manufacturing Company Ltd.
- Wei-Pin Changchien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monolithic stacked integrated circuits with a redundant layer for r...
- Patent number 9,847,318
- Issue date Dec 19, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kuan-Yu Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Oxide definition (OD) gradient reduced semiconductor device
- Patent number 9,601,478
- Issue date Mar 21, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Lin Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit comprising buffer chain
- Patent number 9,478,469
- Issue date Oct 25, 2016
- Taiwan Semiconductor Manufacturing Company Limited
- Yi-Lin Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Diagnosis framework to shorten yield learning cycles of advanced pr...
- Patent number 9,310,431
- Issue date Apr 12, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yen-Ling Liu
- G01 - MEASURING TESTING
Information Patent Grant
Oxide definition (OD) gradient reduced semiconductor device and met...
- Patent number 9,286,431
- Issue date Mar 15, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Lin Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Repairing monolithic stacked integrated circuits with a redundant l...
- Patent number 9,269,640
- Issue date Feb 23, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kuan-Yu Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for diagnosing an integrated circuit
- Patent number 9,097,762
- Issue date Aug 4, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kin Lam Tong
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit comprising buffer chain
- Patent number 8,981,842
- Issue date Mar 17, 2015
- Taiwan Semiconductor Manufacturing Company Limited
- Yi-Lin Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage-controlled oscillator
- Patent number 8,937,512
- Issue date Jan 20, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd
- Bo-Jr Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Group bounding box region-constrained placement for integrated circ...
- Patent number 8,701,070
- Issue date Apr 15, 2014
- Taiwan Semiconductor Manufacturing Company Limited
- Yi-Lin Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting small delay defects
- Patent number 8,566,766
- Issue date Oct 22, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Grant
RC delay detectors with high sensitivity for through substrate vias
- Patent number 8,384,430
- Issue date Feb 26, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Nan-Hsin Tseng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing processor power consumption
- Patent number 8,347,132
- Issue date Jan 1, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Lee-Chung Lu
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
System and method for detecting soft-fails
- Patent number 8,339,155
- Issue date Dec 25, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Nan-Hsin Tseng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for characterizing process variations
- Patent number 8,258,883
- Issue date Sep 4, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Wei Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Methods for detecting defect connections between metal bumps
- Patent number 8,113,412
- Issue date Feb 14, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Nan-Hsin Tseng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR PACKAGES AND METHODS OF MANUFACTURING THEREOF
- Publication number 20240063074
- Publication date Feb 22, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Yu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Machine-Learning Design Enablement Platform
- Publication number 20200272777
- Publication date Aug 27, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yi-Lin CHUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD TO DIAGNOSE INTEGRATED CIRCUIT
- Publication number 20190242943
- Publication date Aug 8, 2019
- Taiwan Semiconductor Manufacturing company Ltd.
- WEI-PIN CHANGCHIEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE-LEARNING DESIGN ENABLEMENT PLATFORM
- Publication number 20180268096
- Publication date Sep 20, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yi-Lin CHUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD TO DIAGNOSE INTEGRATED CIRCUIT
- Publication number 20170176525
- Publication date Jun 22, 2017
- Taiwan Semiconductor Manufacturing company Ltd.
- WEI-PIN CHANGCHIEN
- G01 - MEASURING TESTING
Information Patent Application
OXIDE DEFINITION (OD) GRADIENT REDUCED SEMICONDUCTOR DEVICE
- Publication number 20160163687
- Publication date Jun 9, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Lin CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Repairing Monolithic Stacked Integrated Circuits with a Redundant L...
- Publication number 20160163680
- Publication date Jun 9, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kuan-Yu Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCAN FLIP-FLOP
- Publication number 20160091563
- Publication date Mar 31, 2016
- Taiwan Semiconductor Manufacturing Company Limited
- Chuang-Hao Lu
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT COMPRISING BUFFER CHAIN
- Publication number 20150187666
- Publication date Jul 2, 2015
- Taiwan Semiconductor Manufacturing Company Limited
- Yi-Lin Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus for Repairing Monolithic Stacked Integrated Ci...
- Publication number 20150115329
- Publication date Apr 30, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kuan-Yu Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OXIDE DEFINITION (OD) GRADIENT REDUCED SEMICONDUCTOR DEVICE AND MET...
- Publication number 20150115395
- Publication date Apr 30, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Lin CHUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GROUP BOUNDING BOX REGION-CONSTRAINED PLACEMENT FOR INTEGRATED CIRC...
- Publication number 20140075404
- Publication date Mar 13, 2014
- Taiwan Semiconductor Manufacturing Company Limited
- Yi-Lin Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Diagnosis Framework to Shorten Yield Learning Cycles of Advanced Pr...
- Publication number 20140049281
- Publication date Feb 20, 2014
- Taiwan Semiconductor Manufacturing Co., LTD
- Yen-Ling Liu
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Diagnosing an Integrated Circuit
- Publication number 20130305112
- Publication date Nov 14, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kin Lam Tong
- G01 - MEASURING TESTING
Information Patent Application
Method for Detecting Small Delay Defects
- Publication number 20120112763
- Publication date May 10, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar Goel
- G01 - MEASURING TESTING
Information Patent Application
RC Delay Detectors with High Sensitivity for Through Substrate Vias
- Publication number 20120038388
- Publication date Feb 16, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Nan-Hsin Tseng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
System and Method for Detecting Soft-Fails
- Publication number 20110121856
- Publication date May 26, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Nan-Hsin Tseng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
System and Method for Characterizing Process Variations
- Publication number 20100176890
- Publication date Jul 15, 2010
- Yi-Wei Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
System and Method for Reducing Processor Power Consumption
- Publication number 20100174933
- Publication date Jul 8, 2010
- Lee-Chung Lu
- G06 - COMPUTING CALCULATING COUNTING

WEI-PIN CHANGCHIEN

Person

Patents Grantslast 30 patents

Machine-learning design enablement platform

System and method to diagnose integrated circuit

Machine-learning design enablement platform

System and method to diagnose integrated circuit

Monolithic stacked integrated circuits with a redundant layer for r...

Oxide definition (OD) gradient reduced semiconductor device

Integrated circuit comprising buffer chain

Diagnosis framework to shorten yield learning cycles of advanced pr...

Oxide definition (OD) gradient reduced semiconductor device and met...

Repairing monolithic stacked integrated circuits with a redundant l...

Method and apparatus for diagnosing an integrated circuit

Integrated circuit comprising buffer chain

Voltage-controlled oscillator

Group bounding box region-constrained placement for integrated circ...

Method for detecting small delay defects

RC delay detectors with high sensitivity for through substrate vias

System and method for reducing processor power consumption

System and method for detecting soft-fails

System and method for characterizing process variations

Methods for detecting defect connections between metal bumps

Patents Applicationslast 30 patents

SEMICONDUCTOR PACKAGES AND METHODS OF MANUFACTURING THEREOF

Machine-Learning Design Enablement Platform

SYSTEM AND METHOD TO DIAGNOSE INTEGRATED CIRCUIT

MACHINE-LEARNING DESIGN ENABLEMENT PLATFORM

SYSTEM AND METHOD TO DIAGNOSE INTEGRATED CIRCUIT

OXIDE DEFINITION (OD) GRADIENT REDUCED SEMICONDUCTOR DEVICE

Repairing Monolithic Stacked Integrated Circuits with a Redundant L...

SCAN FLIP-FLOP

INTEGRATED CIRCUIT COMPRISING BUFFER CHAIN

Method and Apparatus for Repairing Monolithic Stacked Integrated Ci...

OXIDE DEFINITION (OD) GRADIENT REDUCED SEMICONDUCTOR DEVICE AND MET...

GROUP BOUNDING BOX REGION-CONSTRAINED PLACEMENT FOR INTEGRATED CIRC...

Diagnosis Framework to Shorten Yield Learning Cycles of Advanced Pr...

Method and Apparatus for Diagnosing an Integrated Circuit

Method for Detecting Small Delay Defects

RC Delay Detectors with High Sensitivity for Through Substrate Vias

System and Method for Detecting Soft-Fails

System and Method for Characterizing Process Variations

System and Method for Reducing Processor Power Consumption