Wei-Ta FU

Person

Taoyuan City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,867,595
- Issue date Jan 9, 2024
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,579,099
- Issue date Feb 14, 2023
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
Device and method applicable for measuring ultrathin thickness of f...
- Patent number 11,287,253
- Issue date Mar 29, 2022
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for mixing solution
- Patent number 10,545,082
- Issue date Jan 28, 2020
- INNOVATIVE NANOTECH INCORPORATED
- Hsin-Chia Ho
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Contactless dual-plane positioning method and device
- Patent number 10,352,694
- Issue date Jul 16, 2019
- Industrial Technology Research Institute
- Guo-Dung Chen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus for samples with a miniscule measurem...
- Patent number 10,151,713
- Issue date Dec 11, 2018
- Industrial Technology Research Institute
- Wen-Li Wu
- G01 - MEASURING TESTING
Information Patent Grant
Embedded component substrate and method for fabricating the same
- Patent number 9,894,779
- Issue date Feb 13, 2018
- NAN YA PCB Corp.
- Wei-Ta Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for aligning two plates during transmission sm...
- Patent number 9,847,242
- Issue date Dec 19, 2017
- Industrial Technology Research Institute
- Wen-Li Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display device and positioning method
- Patent number 9,696,959
- Issue date Jul 4, 2017
- QISDA (SUZHOU) CO., LTD.
- Wei-Feng Fu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for monitoring particles in solution
- Patent number 9,625,365
- Issue date Apr 18, 2017
- Industrial Technology Research Institute
- Hsin-Chia Ho
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Apparatus and method of applying small-angle electron scattering to...
- Patent number 9,390,888
- Issue date Jul 12, 2016
- Industrial Technology Research Institute
- Wen-Li Wu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for amplifying intensity during transmission small angle—...
- Patent number 9,297,772
- Issue date Mar 29, 2016
- Industrial Technology Research Institute
- Wei-En Fu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...
- Publication number 20240102950
- Publication date Mar 28, 2024
- Industrial Technology Research Institute
- Chun-Ting LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
- Publication number 20240094148
- Publication date Mar 21, 2024
- Industrial Technology Research Institute
- Bo-Ching HE
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION PLATFORM FOR LITHOGRAPHY
- Publication number 20230131662
- Publication date Apr 27, 2023
- Industrial Technology Research Institute
- Cheng-Hsien CHEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
- Publication number 20220120561
- Publication date Apr 21, 2022
- Industrial Technology Research Institute
- Chun-Ting LIU
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD APPLICABLE FOR MEASURING ULTRATHIN THICKNESS OF F...
- Publication number 20210199428
- Publication date Jul 1, 2021
- Industrial Technology Research Institute
- Chun-Ting LIU
- G01 - MEASURING TESTING
Information Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
- Publication number 20210109042
- Publication date Apr 15, 2021
- Industrial Technology Research Institute
- Chun-Ting LIU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR SHARING PRIVACY DATA BASED ON SMART CONTRACTS
- Publication number 20200090795
- Publication date Mar 19, 2020
- HTC CORPORATION
- Edward Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTACTLESS DUAL-PLANE POSITIONING METHOD AND DEVICE
- Publication number 20180299266
- Publication date Oct 18, 2018
- Industrial Technology Research Institute
- Guo-Dung CHEN
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS
- Publication number 20180128726
- Publication date May 10, 2018
- Industrial Technology Research Institute
- Yen-Liang Lin
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MIXING SOLUTION
- Publication number 20170065941
- Publication date Mar 9, 2017
- Industrial Technology Research Institute
- Hsin-Chia Ho
- G01 - MEASURING TESTING
Information Patent Application
X-RAY REFLECTOMETRY APPARATUS FOR SAMPLES WITH A MINISCULE MEASUREM...
- Publication number 20160341674
- Publication date Nov 24, 2016
- Industrial Technology Research Institute
- Wen-Li WU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR ALIGNING TWO PLATES DURING TRANSMISSION SM...
- Publication number 20160187267
- Publication date Jun 30, 2016
- Industrial Technology Research Institute
- Wen-Li Wu
- G01 - MEASURING TESTING
Information Patent Application
EMBEDDED COMPONENT SUBSTRATE AND METHOD FOR FABRICATING THE SAME
- Publication number 20160007469
- Publication date Jan 7, 2016
- NAN YA PCB Corporation
- Wei-Ta FU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS AND METHOD OF APPLYING SMALL-ANGLE ELECTRON SCATTERING TO...
- Publication number 20150340201
- Publication date Nov 26, 2015
- Industrial Technology Research Institute
- Wen-Li Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR MIXING SOLUTION AND SYSTEM AND METHOD FOR...
- Publication number 20150330886
- Publication date Nov 19, 2015
- Industrial Technology Research Institute
- Hsin-Chia Ho
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE AND POSITIONING METHOD
- Publication number 20150268918
- Publication date Sep 24, 2015
- Qisda (SuZhou) Co., ltd
- WEI-FENG FU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR AMPLIFYING INTENSITY DURING TRANSMISSION SMALL ANGLE-...
- Publication number 20150036805
- Publication date Feb 5, 2015
- Industrial Technology Research Institute
- Wei-En FU
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

X-ray reflectometry apparatus and method thereof for measuring thre...

X-ray reflectometry apparatus and method thereof for measuring thre...

Device and method applicable for measuring ultrathin thickness of f...

Apparatus for mixing solution

Contactless dual-plane positioning method and device

X-ray reflectometry apparatus for samples with a miniscule measurem...

Embedded component substrate and method for fabricating the same

Apparatus and method for aligning two plates during transmission sm...

Display device and positioning method

System and method for monitoring particles in solution

Apparatus and method of applying small-angle electron scattering to...

Apparatus for amplifying intensity during transmission small angle—...

Patents Applicationslast 30 patents

METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...

X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...

INSPECTION METHOD AND INSPECTION PLATFORM FOR LITHOGRAPHY

X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...

DEVICE AND METHOD APPLICABLE FOR MEASURING ULTRATHIN THICKNESS OF F...

X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...

METHOD AND SYSTEM FOR SHARING PRIVACY DATA BASED ON SMART CONTRACTS

CONTACTLESS DUAL-PLANE POSITIONING METHOD AND DEVICE

ANALYSIS APPARATUS

APPARATUS AND METHOD FOR MIXING SOLUTION

X-RAY REFLECTOMETRY APPARATUS FOR SAMPLES WITH A MINISCULE MEASUREM...

APPARATUS AND METHOD FOR ALIGNING TWO PLATES DURING TRANSMISSION SM...

EMBEDDED COMPONENT SUBSTRATE AND METHOD FOR FABRICATING THE SAME

APPARATUS AND METHOD OF APPLYING SMALL-ANGLE ELECTRON SCATTERING TO...

APPARATUS AND METHOD FOR MIXING SOLUTION AND SYSTEM AND METHOD FOR...

DISPLAY DEVICE AND POSITIONING METHOD

APPARATUS FOR AMPLIFYING INTENSITY DURING TRANSMISSION SMALL ANGLE-...