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Wei-Te Chu
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Kaohsiung, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Testing device and method for testing a device under test
Patent number
12,032,001
Issue date
Jul 9, 2024
Advanced Semiconductor Engineering, Inc.
Jia Jin Lin
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor package with integrated optical diffuser and filter
Patent number
11,569,422
Issue date
Jan 31, 2023
Advanced Semiconductor Engineering, Inc.
Wei-Tang Chu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Biological detection device and method utilizing LCPCF film for tes...
Patent number
9,164,077
Issue date
Oct 20, 2015
National Chiao Tung University
Yi-Hsin Lin
G01 - MEASURING TESTING
Information
Patent Grant
Package, packaging method and substrate thereof for sliding type th...
Patent number
8,050,467
Issue date
Nov 1, 2011
Chipbond Technology Corporation
Charles Yang
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
TESTING DEVICE AND METHOD FOR TESTING A DEVICE UNDER TEST
Publication number
20230333139
Publication date
Oct 19, 2023
Advanced Semiconductor Engineering, Inc.
Jia Jin LIN
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR PACKAGE STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
Publication number
20230037713
Publication date
Feb 9, 2023
Advanced Semiconductor Engineering, Inc.
Wei-Tang CHU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR PACKAGE WITH INTEGRATED OPTICAL DIFFUSER AND FILTER
Publication number
20220077364
Publication date
Mar 10, 2022
Advanced Semiconductor Engineering, Inc.
Wei-Tang CHU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL SENSOR PACKAGE STRUCTURE AND OPTICAL MODULE STRUCTURE
Publication number
20210313476
Publication date
Oct 7, 2021
Advanced Semiconductor Engineering, Inc.
Chun Yu KO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BIOLOGICAL DETECTION DEVICE AND DETECTING METHOD
Publication number
20130167621
Publication date
Jul 4, 2013
Yi-Hsin LIN
G01 - MEASURING TESTING
Information
Patent Application
Package, packaging method and substrate thereof for sliding type th...
Publication number
20090073632
Publication date
Mar 19, 2009
International Semiconductor Technology Ltd.
Charles Yang
G06 - COMPUTING CALCULATING COUNTING