Wei Ti Lee

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistive switching memory having confined filament formation and m...
- Patent number 11,997,932
- Issue date May 28, 2024
- Crossbar, Inc.
- Sundar Narayanan
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 11,988,502
- Issue date May 21, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,906,451
- Issue date Feb 20, 2024
- Nova Ltd.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Feed-forward of multi-layer and multi-process information using XPS...
- Patent number 11,733,035
- Issue date Aug 22, 2023
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
XPS metrology for process control in selective deposition
- Patent number 11,680,915
- Issue date Jun 20, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Charles Larson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,668,663
- Issue date Jun 6, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
XPS metrology for process control in selective deposition
- Patent number 11,346,795
- Issue date May 31, 2022
- NOVA MEASURING INSTRUMENTS, INC.
- Charles Thomas Larson
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Multi-stage clock generator using mutual injection for multi-phase...
- Patent number 11,063,600
- Issue date Jul 13, 2021
- Apple Inc.
- Wenbo Liu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Feed-forward of multi-layer and multi-process information using XPS...
- Patent number 11,029,148
- Issue date Jun 8, 2021
- NOVA MEASURING INSTRUMENTS, INC.
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Grant
XPS metrology for process control in selective deposition
- Patent number 10,801,978
- Issue date Oct 13, 2020
- NOVA MEASURING INSTRUMENTS, INC.
- Charles Thomas Larson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Feed-forward of multi-layer and multi-process information using XPS...
- Patent number 10,648,802
- Issue date May 12, 2020
- NOVA MEASURING INSTRUMENTS, INC.
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 10,533,961
- Issue date Jan 14, 2020
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- G01 - MEASURING TESTING
Information Patent Grant
Feed-forward of multi-layer and multi-process information using XPS...
- Patent number 10,082,390
- Issue date Sep 25, 2018
- Nova Measuring Instruments Inc.
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Grant
Silicon germanium thickness and composition determination using com...
- Patent number 9,952,166
- Issue date Apr 24, 2018
- Nova Measuring Instruments Inc.
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Grant
Methods for forming barrier/seed layers for copper interconnect str...
- Patent number 9,926,639
- Issue date Mar 27, 2018
- Applied Materials, Inc.
- Hoon Kim
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Resistive switching devices having a switching layer and an interme...
- Patent number 9,818,939
- Issue date Nov 14, 2017
- Adesto Technologies Corporation
- John R. Jameson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon germanium thickness and composition determination using com...
- Patent number 9,594,035
- Issue date Mar 14, 2017
- ReVera, Incorporated
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Grant
Gas line weldment design and process for CVD aluminum
- Patent number 9,593,417
- Issue date Mar 14, 2017
- Applied Materials, Inc.
- Wei Ti Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Resistive switching devices having a switching layer and an interme...
- Patent number 9,252,359
- Issue date Feb 2, 2016
- Adesto Technologies Corporation
- John R. Jameson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation of liner and barrier for tungsten as gate electrode and a...
- Patent number 9,129,945
- Issue date Sep 8, 2015
- Applied Materials, Inc.
- Sang-Hyeob Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Solid electrolyte memory elements with electrode interface for impr...
- Patent number 9,099,633
- Issue date Aug 4, 2015
- Adesto Technologies Corporation
- Chakravarthy Gopalan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Programmable memory elements, devices and methods having physically...
- Patent number 8,895,953
- Issue date Nov 25, 2014
- Adesto Technologies Corporation
- Jeffrey Allan Shields
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistive switching devices having a buffer layer and methods of fo...
- Patent number 8,866,122
- Issue date Oct 21, 2014
- Adesto Technologies Corporation
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistive switching devices having alloyed electrodes and methods o...
- Patent number 8,847,192
- Issue date Sep 30, 2014
- Adesto Technologies France SARL
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal gate structures and methods for forming thereof
- Patent number 8,637,390
- Issue date Jan 28, 2014
- Applied Materials, Inc.
- Seshadri Ganguli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas line weldment design and process for CVD aluminum
- Patent number 8,535,443
- Issue date Sep 17, 2013
- Applied Materials, Inc.
- Wei Ti Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Aluminum contact integration on cobalt silicide junction
- Patent number 7,867,900
- Issue date Jan 11, 2011
- Applied Materials, Inc.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Unique passivation technique for a CVD blocker plate to prevent par...
- Patent number 7,857,947
- Issue date Dec 28, 2010
- Applied Materials, Inc.
- Alan A. Ritchie
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Deposition processes for titanium nitride barrier and aluminum
- Patent number 7,824,743
- Issue date Nov 2, 2010
- Applied Materials, Inc.
- Wei Ti Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
- Publication number 20240085174
- Publication date Mar 14, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION
- Publication number 20240044825
- Publication date Feb 8, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Charles LARSON
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20230408430
- Publication date Dec 21, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SMALL SPOT
- Publication number 20230288196
- Publication date Sep 14, 2023
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION
- Publication number 20230021209
- Publication date Jan 19, 2023
- NOVA MEASURING INSTRUMENTS INC.
- Charles LARSON
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
RESISTIVE SWITCHING MEMORY HAVING CONFINED FILAMENT FORMATION AND M...
- Publication number 20220320432
- Publication date Oct 6, 2022
- Crossbar, Inc.
- Sundar Narayanan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VARYING NITROGEN CONTENT IN SWITCHING LAYER OF TWO-TERMINAL RESISTI...
- Publication number 20220320431
- Publication date Oct 6, 2022
- Crossbar, Inc.
- Sundar Narayanan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20220074878
- Publication date Mar 10, 2022
- NOVA LTD
- Wei Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
- Publication number 20210372787
- Publication date Dec 2, 2021
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION
- Publication number 20210025839
- Publication date Jan 28, 2021
- Nova Measuring Instruments, Inc.
- Charles Thomas Larson
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
- Publication number 20200370885
- Publication date Nov 26, 2020
- Nova Measuring Instruments, Inc.
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20200191734
- Publication date Jun 18, 2020
- Nova Measuring Instruments, Inc.
- Wei Ti Lee
- G01 - MEASURING TESTING
Information Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
- Publication number 20190360800
- Publication date Nov 28, 2019
- Nova Measuring Instruments, Inc.
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Application
XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION
- Publication number 20190277783
- Publication date Sep 12, 2019
- Nova Measuring Instruments, Inc.
- Charles Thomas Larson
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
- Publication number 20190033069
- Publication date Jan 31, 2019
- Nova Measuring Instruments, Inc.
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20180328871
- Publication date Nov 15, 2018
- Nova Measuring Instruments, Inc.
- Wei Ti Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20180172609
- Publication date Jun 21, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Wei Ti LEE
- G01 - MEASURING TESTING
Information Patent Application
SILICON GERMANIUM THICKNESS AND COMPOSITION DETERMINATION USING COM...
- Publication number 20170176357
- Publication date Jun 22, 2017
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Application
Feed-Forward of Multi-Layer and Multi-Process Information using XPS...
- Publication number 20170160081
- Publication date Jun 8, 2017
- ReVera, Incorporated
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Application
Resistive Switching Devices Having a Switching Layer and an Interme...
- Publication number 20160118585
- Publication date Apr 28, 2016
- ADESTO TECHNOLOGIES CORPORATION
- John R. Jameson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROGRAMMABLE RESISTANCE MEMORY ELEMENTS WITH ELECTRODE INTERFACE LA...
- Publication number 20160043310
- Publication date Feb 11, 2016
- ADESTO TECHNOLOGIES CORPORATION
- Chakravarthy Gopalan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON GERMANIUM THICKNESS AND COMPOSITION DETERMINATION USING COM...
- Publication number 20150308969
- Publication date Oct 29, 2015
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Application
PROGRAMMABLE IMPEDANCE MEMORY ELEMENTS AND CORRESPONDING METHODS
- Publication number 20140293676
- Publication date Oct 2, 2014
- Wei Ti Lee
- G11 - INFORMATION STORAGE
Information Patent Application
Resistive Switching Devices Having a Switching Layer And An Interme...
- Publication number 20140246641
- Publication date Sep 4, 2014
- ADESTO TECHNOLOGIES CORPORATION
- John R. Jameson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS LINE WELDMENT DESIGN AND PROCESS FOR CVD ALUMINUM
- Publication number 20140053776
- Publication date Feb 27, 2014
- Applied Materials, Inc.
- Wei Ti Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SOLID ELECTROLYTE MEMORY ELEMENTS WITH ELECTRODE INTERFACE FOR IMPR...
- Publication number 20130285004
- Publication date Oct 31, 2013
- Chakravarthy Gopalan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHEMICAL VAPOR DEPOSITION (CVD) OF RUTHENIUM FILMS AND APPLICATIONS...
- Publication number 20130146468
- Publication date Jun 13, 2013
- Applied Materials, Inc.
- HOON KIM
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Resistive Switching Devices Having Alloyed Electrodes And Methods o...
- Publication number 20130062587
- Publication date Mar 14, 2013
- ADESTO TECHNOLOGIES CORP.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FORMING BARRIER/SEED LAYERS FOR COPPER INTERCONNECT STR...
- Publication number 20120012465
- Publication date Jan 19, 2012
- Applied Materials, Inc.
- HOON KIM
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
CHEMICAL VAPOR DEPOSITION OF RUTHENIUM FILMS CONTAINING OXYGEN OR C...
- Publication number 20110312148
- Publication date Dec 22, 2011
- Applied Materials, Inc.
- HOON KIM
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Person

Patents Grantslast 30 patents

Method and system for non-destructive metrology of thin layers

Resistive switching memory having confined filament formation and m...

Characterizing and measuring in small boxes using XPS with multiple...

Method and system for non-destructive metrology of thin layers

Feed-forward of multi-layer and multi-process information using XPS...

XPS metrology for process control in selective deposition

Method and system for non-destructive metrology of thin layers

XPS metrology for process control in selective deposition

Multi-stage clock generator using mutual injection for multi-phase...

Feed-forward of multi-layer and multi-process information using XPS...

XPS metrology for process control in selective deposition

Feed-forward of multi-layer and multi-process information using XPS...

Method and system for non-destructive metrology of thin layers

Feed-forward of multi-layer and multi-process information using XPS...

Silicon germanium thickness and composition determination using com...

Methods for forming barrier/seed layers for copper interconnect str...

Resistive switching devices having a switching layer and an interme...

Silicon germanium thickness and composition determination using com...

Gas line weldment design and process for CVD aluminum

Resistive switching devices having a switching layer and an interme...

Formation of liner and barrier for tungsten as gate electrode and a...

Solid electrolyte memory elements with electrode interface for impr...

Programmable memory elements, devices and methods having physically...

Resistive switching devices having a buffer layer and methods of fo...

Resistive switching devices having alloyed electrodes and methods o...

Metal gate structures and methods for forming thereof

Gas line weldment design and process for CVD aluminum

Aluminum contact integration on cobalt silicide junction

Unique passivation technique for a CVD blocker plate to prevent par...

Deposition processes for titanium nitride barrier and aluminum

Patents Applicationslast 30 patents

FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...

XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

SMALL SPOT

XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION

RESISTIVE SWITCHING MEMORY HAVING CONFINED FILAMENT FORMATION AND M...

VARYING NITROGEN CONTENT IN SWITCHING LAYER OF TWO-TERMINAL RESISTI...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...

XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION

FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...

XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION

FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

SILICON GERMANIUM THICKNESS AND COMPOSITION DETERMINATION USING COM...

Feed-Forward of Multi-Layer and Multi-Process Information using XPS...

Resistive Switching Devices Having a Switching Layer and an Interme...

PROGRAMMABLE RESISTANCE MEMORY ELEMENTS WITH ELECTRODE INTERFACE LA...

SILICON GERMANIUM THICKNESS AND COMPOSITION DETERMINATION USING COM...

PROGRAMMABLE IMPEDANCE MEMORY ELEMENTS AND CORRESPONDING METHODS

Resistive Switching Devices Having a Switching Layer And An Interme...

GAS LINE WELDMENT DESIGN AND PROCESS FOR CVD ALUMINUM

SOLID ELECTROLYTE MEMORY ELEMENTS WITH ELECTRODE INTERFACE FOR IMPR...

CHEMICAL VAPOR DEPOSITION (CVD) OF RUTHENIUM FILMS AND APPLICATIONS...

Resistive Switching Devices Having Alloyed Electrodes And Methods o...

METHODS FOR FORMING BARRIER/SEED LAYERS FOR COPPER INTERCONNECT STR...

CHEMICAL VAPOR DEPOSITION OF RUTHENIUM FILMS CONTAINING OXYGEN OR C...