Wei Ting Chien

Person

Shanghai, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for predicting high-temperature operating life of...
- Patent number 10,041,994
- Issue date Aug 7, 2018
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wei-Ting Chien
- G01 - MEASURING TESTING
Information Patent Grant
Dual damascene copper process using a selected mask
- Patent number 8,685,853
- Issue date Apr 1, 2014
- Semiconductor Manufacturing International (Shanghai) Corporation
- Fan Chung Tseng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for conducting accelerated soft error rate testing
- Patent number 8,106,664
- Issue date Jan 31, 2012
- Semiconductor Manufacturing International (Shanghai) Corporation
- Jung-Che Chang
- G01 - MEASURING TESTING
Information Patent Grant
Method and computer code for statistical process control for censor...
- Patent number 8,024,139
- Issue date Sep 20, 2011
- Semiconductor Manufacturing International (Shanghai) Corporation
- Siyuan Frank Yang
- G05 - CONTROLLING REGULATING
Information Patent Grant
Dual damascence copper process using a selected mask
- Patent number 7,989,341
- Issue date Aug 2, 2011
- Semiconductor Manufacturing International (Shanghai) Corporation
- Fan Chung Tseng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Knowledge-based statistical method and system to determine reliabil...
- Patent number 7,660,699
- Issue date Feb 9, 2010
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wei-Ting Kary Chien
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Using reverse arrangement for trend test in statistical process con...
- Patent number 7,595,205
- Issue date Sep 29, 2009
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wei-Ting Kary Chien
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR PREDICTING HIGH-TEMPERATURE OPERATING LIFE OF...
- Publication number 20170285099
- Publication date Oct 5, 2017
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wei-Ting CHIEN
- G01 - MEASURING TESTING
Information Patent Application
Dual Damascene Copper Process Using a Selected Mask
- Publication number 20120108054
- Publication date May 3, 2012
- Semiconductor Manufacturing International (Shanghai) Corporation
- Fan Chung Tseng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and Method for Conducting Accelerated Soft Error Rate Testing
- Publication number 20100001738
- Publication date Jan 7, 2010
- Semiconductor Manufacturing International (Shanghai) Corporation
- Jung-Che Chang
- G01 - MEASURING TESTING
Information Patent Application
Method and Computer Code for Statistical Process Control for Censor...
- Publication number 20090216470
- Publication date Aug 27, 2009
- Semiconductor Manufacturing International (Shanghai) Corporation
- Siyuan Frank Yang
- G05 - CONTROLLING REGULATING
Information Patent Application
Dual Damascene Copper Process Using a Selected Mask
- Publication number 20080020565
- Publication date Jan 24, 2008
- Semiconductor Manufacturing International (Shanghai) Corporation
- Fan Chung Tseng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Using reverse arrangement for trend test in statistical process con...
- Publication number 20070231933
- Publication date Oct 4, 2007
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wei-Ting Kary Chien
- G05 - CONTROLLING REGULATING
Information Patent Application
Knowledge-based statistical method and system to determine reliabil...
- Publication number 20070032973
- Publication date Feb 8, 2007
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wei-Ting Kary Chien
- G05 - CONTROLLING REGULATING

Wei Ting Chien

Person

Patents Grantslast 30 patents

Method and system for predicting high-temperature operating life of...

Dual damascene copper process using a selected mask

System and method for conducting accelerated soft error rate testing

Method and computer code for statistical process control for censor...

Dual damascence copper process using a selected mask

Knowledge-based statistical method and system to determine reliabil...

Using reverse arrangement for trend test in statistical process con...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR PREDICTING HIGH-TEMPERATURE OPERATING LIFE OF...

Dual Damascene Copper Process Using a Selected Mask

System and Method for Conducting Accelerated Soft Error Rate Testing

Method and Computer Code for Statistical Process Control for Censor...

Dual Damascene Copper Process Using a Selected Mask

Using reverse arrangement for trend test in statistical process con...

Knowledge-based statistical method and system to determine reliabil...