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Wei Wang
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for calibrating a rotary encoder and making a hig...
Patent number
7,414,547
Issue date
Aug 19, 2008
3M Innovative Properties Company
Wei Wang
G01 - MEASURING TESTING
Information
Patent Grant
Contactless optical probe for use in semiconductor processing metro...
Patent number
6,856,159
Issue date
Feb 15, 2005
Vanderbilt University
Norman H. Tolk
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHODS OF POWER SUPPLY UNIT ROTATING IN AN INFORMATION HANDLING SY...
Publication number
20170017293
Publication date
Jan 19, 2017
DELL PRODUCTS, L.P.
Mark A. Muccini
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
METHOD AND SYSTEM FOR CALIBRATING A ROTARY ENCODER AND MAKING A HIG...
Publication number
20080149816
Publication date
Jun 26, 2008
3M Innovative Properties Company
Wei Wang
G01 - MEASURING TESTING