Wei Zhao

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
High-power short-pass total internal reflection filter
- Patent number 10,691,024
- Issue date Jun 23, 2020
- KLA-Tencor Corporation
- Wei Zhao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for imaging a sample with an illumination source...
- Patent number 10,616,987
- Issue date Apr 7, 2020
- KLA-Tencor Corporation
- Wei Zhao
- G02 - OPTICS
Information Patent Grant
All reflective wafer defect inspection and review systems and methods
- Patent number 10,309,907
- Issue date Jun 4, 2019
- KLA-Tencor Corporation
- Shiyu Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Managing collaboration of shared content using collaborator indexing
- Patent number 10,193,974
- Issue date Jan 29, 2019
- Box, Inc.
- Kaustubh Rudrawar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for LADAR-based optic alignment and characterization
- Patent number 10,145,944
- Issue date Dec 4, 2018
- KLA-Tencor Corporation
- Anatoly Shchemelinin
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for controlling convective flow in a light-sustai...
- Patent number 9,887,076
- Issue date Feb 6, 2018
- KLA-Tencor Corporation
- Ilya Bezel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for imaging a sample with a laser sustained plasm...
- Patent number 9,558,858
- Issue date Jan 31, 2017
- KLA-Tencor Corporation
- David W. Shortt
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and system for controlling convective flow in a light-sustai...
- Patent number 9,390,902
- Issue date Jul 12, 2016
- KLA-Tencor Corporation
- Ilya Bezel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image intensification for low light inspection
- Patent number 7,570,354
- Issue date Aug 4, 2009
- KLA-Tencor Corporation
- Wei Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Outlier substrate inspection
- Patent number 7,440,607
- Issue date Oct 21, 2008
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
High-Power Short-Pass Total Internal Reflection Filter
- Publication number 20190235390
- Publication date Aug 1, 2019
- KLA-Tencor Corporation
- Wei Zhao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MANAGING COLLABORATION OF SHARED CONTENT USING COLLABORATOR INDEXING
- Publication number 20170180476
- Publication date Jun 22, 2017
- BOX, INC.
- Kaustubh Rudrawar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Imaging a Sample with an Illumination Source...
- Publication number 20170059490
- Publication date Mar 2, 2017
- KLA-Tencor Corporation
- Wei Zhao
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Controlling Convective Flow in a Light-Sustai...
- Publication number 20160322211
- Publication date Nov 3, 2016
- KLA-Tencor Corporation
- Ilya Bezel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALL REFLECTIVE WAFER DEFECT INSPECTION AND REVIEW SYSTEMS AND METHODS
- Publication number 20160258878
- Publication date Sep 8, 2016
- KLA-Tencor Corporation
- Shiyu Zhang
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Imaging a Sample with a Laser Sustained Plasm...
- Publication number 20150048741
- Publication date Feb 19, 2015
- KLA-Tencor Corporation
- David W. Shortt
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and System for Controlling Convective Flow in a Light-Sustai...
- Publication number 20140291546
- Publication date Oct 2, 2014
- KLA-Tencor Corporation
- Ilya Bezel
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

High-power short-pass total internal reflection filter

System and method for imaging a sample with an illumination source...

All reflective wafer defect inspection and review systems and methods

Managing collaboration of shared content using collaborator indexing

System and method for LADAR-based optic alignment and characterization

Method and system for controlling convective flow in a light-sustai...

System and method for imaging a sample with a laser sustained plasm...

Method and system for controlling convective flow in a light-sustai...

Image intensification for low light inspection

Outlier substrate inspection

Patents Applicationslast 30 patents

High-Power Short-Pass Total Internal Reflection Filter

MANAGING COLLABORATION OF SHARED CONTENT USING COLLABORATOR INDEXING

System and Method for Imaging a Sample with an Illumination Source...

Method and System for Controlling Convective Flow in a Light-Sustai...

ALL REFLECTIVE WAFER DEFECT INSPECTION AND REVIEW SYSTEMS AND METHODS

System and Method for Imaging a Sample with a Laser Sustained Plasm...

Method and System for Controlling Convective Flow in a Light-Sustai...