Blacksburg, VA, US
Information
Patent Grant
Virginia Tech Intellectual Properties, Inc.
Aditya Garg
G01 - MEASURING TESTING
Information
Patent Grant
Korea Research Institute of Standards and Science
Eun-Ah You
B82 - NANO-TECHNOLOGY
Information
Patent Application
Virginia Tech Intellectual Properties, Inc.
Aditya Garg
G01 - MEASURING TESTING
Information
Patent Application
Virginia Tech Intellectual Properties, Inc.
Aditya Garg
B82 - NANO-TECHNOLOGY
Information
Patent Application
Virginia Tech Intellectual Properties, Inc.
Wei ZHOU
G01 - MEASURING TESTING
Information
Patent Application
Korea Research Institute of Standards and Science
Eun-Ah YOU
B82 - NANO-TECHNOLOGY
Information
Patent Application
Virginia Tech Intellectual Properties, Inc.
Aditya GARG
G01 - MEASURING TESTING
Information
Patent Application
President and Fellows of Harvard College
Charles M. Lieber
B82 - NANO-TECHNOLOGY
