Wei Zhou

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Minnetonka, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
Inspection of substrates using calibration and imaging
- Patent number 9,664,625
- Issue date May 30, 2017
- Rudolph Technologies, Inc.
- Wei Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Scratch detection method and apparatus
- Patent number 9,406,115
- Issue date Aug 2, 2016
- Rudolph Technologies, Inc.
- Wei Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Position sensitive detection optimization
- Patent number 9,140,601
- Issue date Sep 22, 2015
- Rudolph Technologies, Inc.
- Manjusha Mehendale
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION OF SUBSTRATES USING CALIBRATION AND IMAGING
- Publication number 20150253256
- Publication date Sep 10, 2015
- Rudolph Technologies, Inc.
- Wei Zhou
- G01 - MEASURING TESTING
Information Patent Application
POSITION SENSITIVE DETECTION OPTIMIZATION
- Publication number 20140103188
- Publication date Apr 17, 2014
- Manjusha Mehendale
- G01 - MEASURING TESTING
Information Patent Application
SCRATCH DETECTION METHOD AND APPARATUS
- Publication number 20130216122
- Publication date Aug 22, 2013
- Rudolph Technologies, Inc.
- Wei Zhou
- G02 - OPTICS
Information Patent Application
INFRARED INSPECTION OF BONDED SUBSTRATES
- Publication number 20120287263
- Publication date Nov 15, 2012
- Rudolph Technologies, Inc.
- Wei Zhou
- G01 - MEASURING TESTING