Weidong Wang

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor yield management system and method
- Patent number 8,380,472
- Issue date Feb 19, 2013
- Rudolph Technologies, Inc.
- Weidong Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bitmap cluster analysis of defects in integrated circuits
- Patent number 8,190,952
- Issue date May 29, 2012
- Rudolph Technologies, Inc.
- Tom T. Ho
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor yield management system and method
- Patent number RE42481
- Issue date Jun 21, 2011
- Rudolph Technologies, Inc.
- Weidong Wang
- 700 - Data processing: generic control systems or specific applications
Information Patent Grant
Analysis techniques for multi-level memory
- Patent number 7,954,018
- Issue date May 31, 2011
- Rudolph Technologies, Inc.
- Tom T. Ho
- G11 - INFORMATION STORAGE
Information Patent Grant
Bitmap cluster analysis of defects in integrated circuits
- Patent number 7,685,481
- Issue date Mar 23, 2010
- MKS Instruments, Inc.
- Tom T. Ho
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for analyzing error information from a semiconduc...
- Patent number 6,768,961
- Issue date Jul 27, 2004
- Yield Dyamics, Inc.
- Jonathan B. Buckheit
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus that determines charged particle beam shape codes
- Patent number 6,556,702
- Issue date Apr 29, 2003
- Applied Materials, Inc.
- Stephen A. Rishton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor yield management system and method
- Patent number 6,470,229
- Issue date Oct 22, 2002
- Yield Dynamics, Inc.
- Weidong Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Raster shaped beam, electron beam exposure strategy using a two dim...
- Patent number 6,262,429
- Issue date Jul 17, 2001
- Etec Systems, Inc.
- Stephen A. Rishton
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
CLOUD-BASED ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED...
- Publication number 20140236515
- Publication date Aug 21, 2014
- Tom Thuy Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARCHITECTURE FOR ROOT CAUSE ANALYSIS, PREDICTION, AND MODELING AND...
- Publication number 20130173332
- Publication date Jul 4, 2013
- Tom Thuy Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARCHITECTURE AND METHODS FOR TOOL HEALTH PREDICTION
- Publication number 20130080372
- Publication date Mar 28, 2013
- Tom Thuy Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED TOOL-RELATED...
- Publication number 20130030760
- Publication date Jan 31, 2013
- Tom Thuy Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BITMAP CLUSTER ANALYSIS OF DEFECTS IN INTEGRATED CIRCUITS
- Publication number 20100235690
- Publication date Sep 16, 2010
- MKS Instruments, Inc.
- Tom T. Ho
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor yield management system and method
- Publication number 20080281566
- Publication date Nov 13, 2008
- Weidong Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bitmap cluster analysis of defects in integrated circuits
- Publication number 20070011509
- Publication date Jan 11, 2007
- Tom T. Ho
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor yield management system and method
- Publication number 20060095237
- Publication date May 4, 2006
- Weidong Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for analyzing error information from a semiconduc...
- Publication number 20030055592
- Publication date Mar 20, 2003
- Jonathan B. Buckheit
- G01 - MEASURING TESTING
Information Patent Application
Raster shaped beam, electron beam exposure strategy using a two dim...
- Publication number 20020104970
- Publication date Aug 8, 2002
- Stacey J. Winter
- B82 - NANO-TECHNOLOGY

Weidong Wang

Person

Patents Grantslast 30 patents

Semiconductor yield management system and method

Bitmap cluster analysis of defects in integrated circuits

Semiconductor yield management system and method

Analysis techniques for multi-level memory

Bitmap cluster analysis of defects in integrated circuits

System and method for analyzing error information from a semiconduc...

Method and apparatus that determines charged particle beam shape codes

Semiconductor yield management system and method

Raster shaped beam, electron beam exposure strategy using a two dim...

Patents Applicationslast 30 patents

CLOUD-BASED ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED...

ARCHITECTURE FOR ROOT CAUSE ANALYSIS, PREDICTION, AND MODELING AND...

ARCHITECTURE AND METHODS FOR TOOL HEALTH PREDICTION

ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED TOOL-RELATED...

BITMAP CLUSTER ANALYSIS OF DEFECTS IN INTEGRATED CIRCUITS

Semiconductor yield management system and method

Bitmap cluster analysis of defects in integrated circuits

Semiconductor yield management system and method

System and method for analyzing error information from a semiconduc...

Raster shaped beam, electron beam exposure strategy using a two dim...