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Weijie Wang
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Thousand Oaks, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Metrology probe with built-in angle and method of fabrication thereof
Patent number
11,719,719
Issue date
Aug 8, 2023
Bruker Nano, Inc.
Jeffrey Wong
G01 - MEASURING TESTING
Information
Patent Grant
Torsion wing probe assembly
Patent number
11,555,827
Issue date
Jan 17, 2023
Bruker Nano, Inc.
Shuiqing Hu
G01 - MEASURING TESTING
Information
Patent Grant
Torsion wing probe assembly
Patent number
11,119,118
Issue date
Sep 14, 2021
Bruker Nano, Inc.
Shuiqing Hu
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscopy utilizing separable components
Patent number
10,345,337
Issue date
Jul 9, 2019
Bruker Nano, Inc.
Chanmin Su
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus of electrical property measurement using an AF...
Patent number
9,869,694
Issue date
Jan 16, 2018
Bruker Nano, Inc.
Chunzeng Li
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Miniaturized cantilever probe for scanning probe microscopy and fab...
Patent number
9,709,597
Issue date
Jul 18, 2017
Bruker Nano, Inc.
Weijie Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus of electrical property measurement using an AF...
Patent number
9,213,047
Issue date
Dec 15, 2015
Bruker Nano, Inc.
Chunzeng Li
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Miniaturized cantilever probe for scanning probe microscopy and fab...
Patent number
8,756,710
Issue date
Jun 17, 2014
Bruker Nano, Inc.
Weijie Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method of fabricating a probe device for a metrology instrument and...
Patent number
8,595,860
Issue date
Nov 26, 2013
Bruker Nano, Inc.
Weijie Wang
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
Nano-Mechanical Infrared Spectroscopy System and Method Using Gated...
Publication number
20240168053
Publication date
May 23, 2024
Bruker Nano, Inc.
Martin Wagner
G01 - MEASURING TESTING
Information
Patent Application
Metrology Probe with Built-In Angle and Method of Fabrication Thereof
Publication number
20220404392
Publication date
Dec 22, 2022
Bruker Nano, Inc.
Jeffrey Wong
G01 - MEASURING TESTING
Information
Patent Application
Torsion Wing Probe Assembly
Publication number
20220107339
Publication date
Apr 7, 2022
Bruker Nano, Inc.
Shuiqing Hu
G01 - MEASURING TESTING
Information
Patent Application
Device, and Method of Manufacture, for use in Mechanically Cleaning...
Publication number
20210396784
Publication date
Dec 23, 2021
Bruker Nano, Inc.
Weijie Wang
G01 - MEASURING TESTING
Information
Patent Application
Torsion Wing Probe Assembly
Publication number
20200348333
Publication date
Nov 5, 2020
Bruke Nano, Inc.
Shuiqing Hu
G01 - MEASURING TESTING
Information
Patent Application
SCANNING PROBE MICROSCOPY UTILIZING SEPARABLE COMPONENTS
Publication number
20180299481
Publication date
Oct 18, 2018
BRUKER NANO, INC.
Chanmin Su
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
Publication number
20160178659
Publication date
Jun 23, 2016
Bruker Nano, Inc.
Chunzeng Li
G01 - MEASURING TESTING
Information
Patent Application
MINIATURIZED CANTILEVER PROBE FOR SCANNING PROBE MICROSCOPY AND FAB...
Publication number
20140366230
Publication date
Dec 11, 2014
Weijie Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
Publication number
20130276174
Publication date
Oct 17, 2013
Chunzeng Li
B82 - NANO-TECHNOLOGY
Information
Patent Application
METHOD OF FABRICATING A PROBE DEVICE FOR A METROLOGY INSTRUMENT AND...
Publication number
20090205092
Publication date
Aug 13, 2009
VEECO INSTRUMENTS INC.
Weijie Wang
G01 - MEASURING TESTING