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Weilong Tang
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Alhambra, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Post and tip design for a probe contact
Patent number
7,922,888
Issue date
Apr 12, 2011
Touchdown Technologies, Inc.
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Grant
Torsion spring probe contactor design
Patent number
7,724,010
Issue date
May 25, 2010
Touchdown Technologies, Inc.
Melvin Khoo
G01 - MEASURING TESTING
Information
Patent Grant
Torsion spring probe contactor design
Patent number
7,362,119
Issue date
Apr 22, 2008
Touchdown Technologies, Inc.
Melvin Khoo
G01 - MEASURING TESTING
Information
Patent Grant
Process for forming microstructures
Patent number
7,271,022
Issue date
Sep 18, 2007
Touchdown Technologies, Inc.
Weilong Tang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Process for forming MEMS
Patent number
7,264,984
Issue date
Sep 4, 2007
Touchdown Technologies, Inc.
Raffi Garabedian
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Post and tip design for a probe contact
Patent number
7,245,135
Issue date
Jul 17, 2007
Touchdown Technologies, Inc.
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Grant
Batch fabricated semiconductor thin-film pressure sensor and method...
Patent number
6,700,174
Issue date
Mar 2, 2004
Integrated Micromachines, Inc.
Denny K. Miu
G01 - MEASURING TESTING
Information
Patent Grant
Silicon bulk-micromachined electromagnetic fiber-optics bypass micr...
Patent number
6,556,737
Issue date
Apr 29, 2003
Integrated Micromachines, Inc.
Denny K. Miu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Micromachined acceleration activated mechanical switch and electrom...
Patent number
6,262,463
Issue date
Jul 17, 2001
Integrated Micromachines, Inc.
Denny K. Miu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Batch fabricated semiconductor micro-switch
Patent number
5,821,596
Issue date
Oct 13, 1998
Integrated Micromachines, Inc.
Denny K. Miu
G01 - MEASURING TESTING
Information
Patent Grant
Bulk fabricated electromagnetic micro-relays/micro-switches and met...
Patent number
5,778,513
Issue date
Jul 14, 1998
Miu; Denny K.
Denny K. Miu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Bulk micromachined inductive transducers on silicon
Patent number
5,724,015
Issue date
Mar 3, 1998
California Institute of Technology
Yu-Chong Tai
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Patents Applications
last 30 patents
Information
Patent Application
Torsion spring probe contactor design
Publication number
20080106289
Publication date
May 8, 2008
TOUCHDOWN TECHNOLOGIES, INC.
Melvin Khoo
G01 - MEASURING TESTING
Information
Patent Application
Post and tip design for a probe contact
Publication number
20070240306
Publication date
Oct 18, 2007
TOUCHDOWN TECHNOLOGIES., INC.
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Application
Post and tip design for a probe contact
Publication number
20070024297
Publication date
Feb 1, 2007
TOUCHDOWN TECHNOLOGIES, INC.
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Application
Torsion spring probe contactor design
Publication number
20070024298
Publication date
Feb 1, 2007
TOUCHDOWN TECHNOLOGIES, INC.
Melvin Khoo
G01 - MEASURING TESTING
Information
Patent Application
Process for forming microstructures
Publication number
20060134820
Publication date
Jun 22, 2006
TOUCHDOWN TECHNOLOGIES, INC.
Weilong Tang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Process for forming MEMS
Publication number
20060134819
Publication date
Jun 22, 2006
Integrated Micromachines, Inc.
Weilong Tang
B81 - MICRO-STRUCTURAL TECHNOLOGY