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Patents Grants
last 30 patents
Information
Patent Grant
Overlay alignment mark and method for measuring overlay error
Patent number
11,934,109
Issue date
Mar 19, 2024
Zhongke Jingyuan Electron Limited, Beijing (CN)
Weimin Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for data processing
Patent number
11,681,546
Issue date
Jun 20, 2023
Dongfang Jingyuan Electron Limited
Zhaoli Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for data processing
Patent number
11,023,276
Issue date
Jun 1, 2021
Dongfang Jingyuan Electron Limited
Zhaoli Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Abnormality detection for periodic patterns
Patent number
10,789,704
Issue date
Sep 29, 2020
Zhongke Jingyuan Electron Limited
Zhaoli Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Learning based defect classification
Patent number
10,223,615
Issue date
Mar 5, 2019
Dongfang Jingyuan Electron Limited
Weimin Ma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multi-stage/multi-chamber electron-beam inspection system
Patent number
10,134,560
Issue date
Nov 20, 2018
Dongfang Jingyuan Electron Limited
Weimin Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Reference image contour generation
Patent number
10,134,124
Issue date
Nov 20, 2018
Dongfang Jingyuan Electron Limited
Weimin Ma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Augmented automatic defect classification
Patent number
9,928,446
Issue date
Mar 27, 2018
Dongfang Jingyuan Electron Limited
Weimin Ma
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Overlay Alignment Mark and Method for Measuring Overlay Error
Publication number
20210382402
Publication date
Dec 9, 2021
Zhongke Jingyuan Electron Limited, Beijing (CN)
Weimin MA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OVERLAY ALIGNMENT MARK, METHOD FOR MEASURING OVERLAY ERROR, AND MET...
Publication number
20210382401
Publication date
Dec 9, 2021
Zhongke Jingyuan Electron Limited, Beijing (CN)
Chengcheng LIU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and Apparatus for Data Processing
Publication number
20210248005
Publication date
Aug 12, 2021
DONGFANG JINGYUAN ELECTRON LIMITED
Zhaoli Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Abnormality Detection for Periodic Patterns
Publication number
20200242746
Publication date
Jul 30, 2020
Zhongke Jingyuan Electron Limited
Zhaoli Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and Apparatus for Data Processing
Publication number
20190163525
Publication date
May 30, 2019
DONGFANG JINGYUAN ELECTRON LIMITED
Zhaoli Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Electron-Beam Inspection Systems with optimized throughput
Publication number
20190088442
Publication date
Mar 21, 2019
DONGFANG JINGYUAN ELECTRON LIMITED
Weimin Ma
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Learning Based Defect Classification
Publication number
20180060702
Publication date
Mar 1, 2018
DONGFANG JINGYUAN ELECTRON LIMITED
Weimin Ma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Reference Image Contour Generation
Publication number
20180053291
Publication date
Feb 22, 2018
DONGFANG JINGYUAN ELECTRON LIMITED
Weimin Ma
G01 - MEASURING TESTING
Information
Patent Application
AUGMENTED AUTOMATIC DEFECT CLASSIFICATION
Publication number
20180018542
Publication date
Jan 18, 2018
DONGFANG JINGYUAN ELECTRON LIMITED
Weimin Ma
G01 - MEASURING TESTING
Information
Patent Application
Multi-Stage/Multi-Chamber Electron-Beam Inspection System
Publication number
20170301508
Publication date
Oct 19, 2017
DONGFANG JINGYUAN ELECTRON LIMITED
Weimin Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Multi-Stage/Multi-Chamber Electron-Beam Inspection System
Publication number
20170301509
Publication date
Oct 19, 2017
DONGFANG JINGYUAN ELECTRON LIMITED
Weimin Ma
H01 - BASIC ELECTRIC ELEMENTS