Weimin Ma

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Reticle defect inspection with systematic defect filter
- Patent number 9,224,195
- Issue date Dec 29, 2015
- KLA-Tencor Corporation
- Bing Li
- G01 - MEASURING TESTING
Information Patent Grant
Reticle defect inspection with systematic defect filter
- Patent number 8,718,353
- Issue date May 6, 2014
- KLA-Tencor Corporation
- Bing Li
- G01 - MEASURING TESTING
Information Patent Grant
Defect classification
- Patent number 8,165,384
- Issue date Apr 24, 2012
- KLA-Tencor Corporation
- Weimin Ma
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RETICLE DEFECT INSPECTION WITH SYSTEMATIC DEFECT FILTER
- Publication number 20140205179
- Publication date Jul 24, 2014
- KLA-Tencor Corporation
- Bing Li
- G01 - MEASURING TESTING
Information Patent Application
RETICLE DEFECT INSPECTION WITH SYSTEMATIC DEFECT FILTER
- Publication number 20130236084
- Publication date Sep 12, 2013
- KLA-Tencor Corporation
- Bing Li
- G01 - MEASURING TESTING