Weiming Ren

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Fujisawa-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Projection electronic microscope for reducing geometric aberration...
- Patent number 7,855,364
- Issue date Dec 21, 2010
- Ebara Corporation
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Projection imaging type electron microscope
- Patent number 7,423,268
- Issue date Sep 9, 2008
- Nikon Corporation
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROJECTION ELECTRONIC MICROSCOPE FOR REDUCING GEOMETRIC ABERRATION...
- Publication number 20080121820
- Publication date May 29, 2008
- EBARA CORPORATION
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Projection imaging type electron microscope
- Publication number 20060011833
- Publication date Jan 19, 2006
- Nikon Corporation
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS