Weiqiang Sun

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope device and electron beam inspection ap...
- Patent number 11,908,658
- Issue date Feb 20, 2024
- Zhongke Jingyuan Electron Limited
- Qinglang Meng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope device and electron beam inspection ap...
- Patent number 11,908,657
- Issue date Feb 20, 2024
- Zhongke Jingyuan Electron Limited
- Qinglang Meng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter and charged particle beam imaging apparatus
- Patent number 11,756,761
- Issue date Sep 12, 2023
- Zhongke Jingyuan Electron Limited, Beijing (CN)
- Qinglang Meng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-pole deflector for charged particle beam and charged particle...
- Patent number 11,295,928
- Issue date Apr 5, 2022
- Zhongke Jingyuan Electron Limited, Beijing (CN)
- Qinglang Meng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter and charged particle beam imaging apparatus
- Patent number 11,239,044
- Issue date Feb 1, 2022
- Zhongke Jingyuan Electron Limited, Beijing (CN)
- Qinglang Meng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Patterned substrate imaging using multiple electron beams
- Patent number 10,347,460
- Issue date Jul 9, 2019
- Dongfang Jingyuan Electron Limited
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-stage/multi-chamber electron-beam inspection system
- Patent number 10,134,560
- Issue date Nov 20, 2018
- Dongfang Jingyuan Electron Limited
- Weimin Ma
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPE DEVICE AND ELECTRON BEAM INSPECTION AP...
- Publication number 20230005709
- Publication date Jan 5, 2023
- Zhongke Jingyuan Electron Limited, Beijing (CN)
- Qinglang Meng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE DEVICE AND ELECTRON BEAM INSPECTION AP...
- Publication number 20230005704
- Publication date Jan 5, 2023
- Zhongke Jingyuan Electron Limited, Beijing (CN)
- Qinglang Meng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIEN FILTER AND CHARGED PARTICLE BEAM IMAGING APPARATUS
- Publication number 20220157556
- Publication date May 19, 2022
- Zhongke Jingyuan Electron Limited, Beijing (CN)
- Qinglang MENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIEN FILTER AND CHARGED PARTICLE BEAM IMAGING APPARATUS
- Publication number 20210066022
- Publication date Mar 4, 2021
- Zhongke Jingyuan Electron Limited, Beijing (CN)
- Qinglang MENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-POLE DEFLECTOR FOR CHARGED PARTICLE BEAM AND CHARGED PARTICLE...
- Publication number 20210066021
- Publication date Mar 4, 2021
- Zhongke Jingyuan Electron Limited, Beijing (CN)
- Qinglang MENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron-Beam Inspection Systems with optimized throughput
- Publication number 20190088442
- Publication date Mar 21, 2019
- DONGFANG JINGYUAN ELECTRON LIMITED
- Weimin Ma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Patterned Substrate Imaging Using Multiple Electron Beams
- Publication number 20180254167
- Publication date Sep 6, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Stage/Multi-Chamber Electron-Beam Inspection System
- Publication number 20170301508
- Publication date Oct 19, 2017
- DONGFANG JINGYUAN ELECTRON LIMITED
- Weimin Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Stage/Multi-Chamber Electron-Beam Inspection System
- Publication number 20170301509
- Publication date Oct 19, 2017
- DONGFANG JINGYUAN ELECTRON LIMITED
- Weimin Ma
- H01 - BASIC ELECTRIC ELEMENTS

Weiqiang Sun

Person

Patents Grantslast 30 patents

Scanning electron microscope device and electron beam inspection ap...

Scanning electron microscope device and electron beam inspection ap...

Wien filter and charged particle beam imaging apparatus

Multi-pole deflector for charged particle beam and charged particle...

Wien filter and charged particle beam imaging apparatus

Patterned substrate imaging using multiple electron beams

Multi-stage/multi-chamber electron-beam inspection system

Patents Applicationslast 30 patents

SCANNING ELECTRON MICROSCOPE DEVICE AND ELECTRON BEAM INSPECTION AP...

SCANNING ELECTRON MICROSCOPE DEVICE AND ELECTRON BEAM INSPECTION AP...

WIEN FILTER AND CHARGED PARTICLE BEAM IMAGING APPARATUS

WIEN FILTER AND CHARGED PARTICLE BEAM IMAGING APPARATUS

MULTI-POLE DEFLECTOR FOR CHARGED PARTICLE BEAM AND CHARGED PARTICLE...

Electron-Beam Inspection Systems with optimized throughput

Patterned Substrate Imaging Using Multiple Electron Beams

Multi-Stage/Multi-Chamber Electron-Beam Inspection System

Multi-Stage/Multi-Chamber Electron-Beam Inspection System